Michael Laisne

Person

San Diego, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electrical circuit comprising a trim circuit
- Patent number 11,056,210
- Issue date Jul 6, 2021
- Dialog Semiconductor (UK) Limited
- Michael Laisne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Communication interface
- Patent number 10,135,686
- Issue date Nov 20, 2018
- Dialog Semiconductor, Inc.
- Michael Laisne
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Data recirculation in configured scan paths
- Patent number 9,316,690
- Issue date Apr 19, 2016
- QUALCOMM Incorporated
- Songlin Zuo
- G01 - MEASURING TESTING
Information Patent Grant
Daisy chain connection for testing continuity in a semiconductor die
- Patent number 9,024,315
- Issue date May 5, 2015
- Qualcomm, Incorporated
- Hongjun Yao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Techniques providing fiducial markers for failure analysis
- Patent number 8,420,410
- Issue date Apr 16, 2013
- QUALCOMM Incorporated
- Michael Laisne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods utilizing redundancy in semiconductor chip inte...
- Patent number 8,384,417
- Issue date Feb 26, 2013
- QUALCOMM Incorporated
- Michael Laisne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methodologies and tool set for IDDQ verification, debugging and fai...
- Patent number 8,159,255
- Issue date Apr 17, 2012
- Qualcomm, Incorporated
- Michael Laisne
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with improved test capability via reduced pin count
- Patent number 7,932,736
- Issue date Apr 26, 2011
- QUALCOMM Incorporated
- Srinivas Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit with improved test capability via reduced pin count
- Patent number 7,750,660
- Issue date Jul 6, 2010
- QUALCOMM Incorporated
- Srinivas Varadarajan
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
COMMUNICATION INTERFACE
- Publication number 20180198681
- Publication date Jul 12, 2018
- Dialog Semiconductor Inc.
- Michael Laisne
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ADAPTIVE TEST TIME REDUCTION
- Publication number 20170010325
- Publication date Jan 12, 2017
- QUALCOMM Incorporated
- Arul Subbarayan
- G01 - MEASURING TESTING
Information Patent Application
REMOTE BUS WRAPPER FOR TESTING REMOTE CORES USING AUTOMATIC TEST PA...
- Publication number 20160349320
- Publication date Dec 1, 2016
- QUALCOMM Incorporated
- Michael Laisne
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TIMING VERIFICATION
- Publication number 20150199461
- Publication date Jul 16, 2015
- QUALCOMM Incorporated
- Michael Laisne
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DAISY CHAIN CONNECTION FOR TESTING CONTINUITY IN A SEMICONDUCTOR DIE
- Publication number 20140264331
- Publication date Sep 18, 2014
- QUALCOMM Incorporated
- Hongjun Yao
- G01 - MEASURING TESTING
Information Patent Application
LOW COST HIGH THROUGHPUT TSV/MICROBUMP PROBE
- Publication number 20130297981
- Publication date Nov 7, 2013
- QUALCOMM Incorporated
- Shiqun Gu
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT FOR TESTING USING A HIGH-SPEED INPUT/OUTPUT INTE...
- Publication number 20120324302
- Publication date Dec 20, 2012
- QUALCOMM Incorporated
- Baris Arslan
- G01 - MEASURING TESTING
Information Patent Application
DEFECT AND YIELD PREDICTION FOR SEGMENTS OF AN INTEGRATED CIRCUIT
- Publication number 20120110531
- Publication date May 3, 2012
- QUALCOMM Incorporated
- Hongmei Liao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUES FOR ERROR DIAGNOSIS IN VLSI SYSTEMS
- Publication number 20110307748
- Publication date Dec 15, 2011
- QUALCOMM Incorporated
- Michael Laisne
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED VERIFICATION AND ESTIMATION OF QUIESCENT POWER SUPPLY CUR...
- Publication number 20110270548
- Publication date Nov 3, 2011
- QUALCOMM Incorporated
- Songlin Zuo
- G01 - MEASURING TESTING
Information Patent Application
DATA RECIRCULATION IN CONFIGURED SCAN PATHS
- Publication number 20110231720
- Publication date Sep 22, 2011
- QUALCOMM Incorporated
- Songlin Zuo
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUES PROVIDING FIDUCIAL MARKERS FOR FAILURE ANALYSIS
- Publication number 20110164808
- Publication date Jul 7, 2011
- QUALCOMM Incorporated
- Michael Laisne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT WITH IMPROVED TEST CAPABILITY VIA REDUCED PIN COUNT
- Publication number 20100141286
- Publication date Jun 10, 2010
- QUALCOMM Incorporated
- Srinivas Varadarajan
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods Utilizing Redundancy in Semiconductor Chip Inte...
- Publication number 20100060310
- Publication date Mar 11, 2010
- QUALCOMM Incorporated
- Michael Laisne
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODOLOGIES AND TOOL SET FOR IDDQ VERIFICATION, DEBUGGING AND FAI...
- Publication number 20090206868
- Publication date Aug 20, 2009
- QUALCOMM Incorporated
- Michael Laisne
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit with improved test capability via reduced pin count
- Publication number 20070236242
- Publication date Oct 11, 2007
- Srinivas Varadarajan
- G01 - MEASURING TESTING

Michael Laisne

Person

Patents Grantslast 30 patents

Electrical circuit comprising a trim circuit

Communication interface

Data recirculation in configured scan paths

Daisy chain connection for testing continuity in a semiconductor die

Techniques providing fiducial markers for failure analysis

Systems and methods utilizing redundancy in semiconductor chip inte...

Methodologies and tool set for IDDQ verification, debugging and fai...

Integrated circuit with improved test capability via reduced pin count

Integrated circuit with improved test capability via reduced pin count

Patents Applicationslast 30 patents

COMMUNICATION INTERFACE

ADAPTIVE TEST TIME REDUCTION

REMOTE BUS WRAPPER FOR TESTING REMOTE CORES USING AUTOMATIC TEST PA...

METHOD AND APPARATUS FOR TIMING VERIFICATION

DAISY CHAIN CONNECTION FOR TESTING CONTINUITY IN A SEMICONDUCTOR DIE

LOW COST HIGH THROUGHPUT TSV/MICROBUMP PROBE

INTEGRATED CIRCUIT FOR TESTING USING A HIGH-SPEED INPUT/OUTPUT INTE...

DEFECT AND YIELD PREDICTION FOR SEGMENTS OF AN INTEGRATED CIRCUIT

TECHNIQUES FOR ERROR DIAGNOSIS IN VLSI SYSTEMS

AUTOMATED VERIFICATION AND ESTIMATION OF QUIESCENT POWER SUPPLY CUR...

DATA RECIRCULATION IN CONFIGURED SCAN PATHS

TECHNIQUES PROVIDING FIDUCIAL MARKERS FOR FAILURE ANALYSIS

INTEGRATED CIRCUIT WITH IMPROVED TEST CAPABILITY VIA REDUCED PIN COUNT

Systems and Methods Utilizing Redundancy in Semiconductor Chip Inte...

METHODOLOGIES AND TOOL SET FOR IDDQ VERIFICATION, DEBUGGING AND FAI...

Integrated circuit with improved test capability via reduced pin count