Michael Laughery

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Selection of wavelengths for integrated circuit optical metrology
- Patent number 7,474,993
- Issue date Jan 6, 2009
- Timbre Technologies, Inc.
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Grant
Selection of wavelengths for integrated circuit optical metrology
- Patent number 7,216,045
- Issue date May 8, 2007
- Timbre Technologies, Inc.
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Grant
Metrology diffraction signal adaptation for tool-to-tool matching
- Patent number 6,792,328
- Issue date Sep 14, 2004
- Timbre Technologies, Inc.
- Michael Laughery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single pass lithography overlay technique
- Patent number 6,780,550
- Issue date Aug 24, 2004
- Timbre Technologies, Inc.
- Mike Laughery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for real-time library generation of grating profiles
- Patent number 6,768,983
- Issue date Jul 27, 2004
- Timbre Technologies, Inc.
- Nickhil Jakatdar
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Selection of wavelengths for integrated circuit optical metrology
- Publication number 20070198211
- Publication date Aug 23, 2007
- Timbre Technologies, Inc.
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Application
Single pass lithography overlay technique
- Publication number 20040002011
- Publication date Jan 1, 2004
- Mike Laughery
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Selection of wavelengths for integrated circuit optical metrology
- Publication number 20030225535
- Publication date Dec 4, 2003
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Application
Metrology diffraction signal adaptation for tool-to-tool matching
- Publication number 20030187840
- Publication date Oct 2, 2003
- Michael Laughery
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY