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Michael Lemley WRIGHT
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Fredicksburg, VA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Wafer chuck
Patent number
10,663,434
Issue date
May 26, 2020
SONIX, Inc.
Michael Lemley Wright
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Adjustable fixture for scanning acoustic microscopy
Patent number
10,571,433
Issue date
Feb 25, 2020
Sonix, Inc.
Paul Ivan John Keeton
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
System, Method and Apparatus for Ultrasonic Inspection
Publication number
20210356439
Publication date
Nov 18, 2021
SONIX, Inc.
Young-Shin Kwon
G01 - MEASURING TESTING
Information
Patent Application
WAFER CHUCK
Publication number
20180284071
Publication date
Oct 4, 2018
SONIX, Inc.
Michael Lemley WRIGHT
G01 - MEASURING TESTING
Information
Patent Application
ADJUSTABLE FIXTURE FOR SCANNING ACOUSTIC MICROSCOPY
Publication number
20180128782
Publication date
May 10, 2018
SONIX, Inc.
Paul Ivan John KEETON
G01 - MEASURING TESTING