Michael Leutschacher

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Finkenstein, AT

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Patents Grantslast 30 patents

Information Patent Grant
Current distribution device protected against over-voltage conditions
- Patent number 10,073,133
- Issue date Sep 11, 2018
- Infineon Technologies AG
- Michael Leutschacher
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing semiconductor dies
- Patent number 10,018,667
- Issue date Jul 10, 2018
- Infineon Technologies AG
- Erwin Thalmann
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and method for performing an unclamped inductive switchi...
- Patent number 9,933,476
- Issue date Apr 3, 2018
- Infineon Technologies Austria AG
- Michael Leutschacher
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing semiconductor dies and a test apparatus
- Patent number 9,435,849
- Issue date Sep 6, 2016
- Infineon Technologies AG
- Erwin Thalmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Current Distribution Device Protected Against Over-Voltage Conditions
- Publication number 20170292987
- Publication date Oct 12, 2017
- INFINEON TECHNOLOGIES AG
- Michael Leutschacher
- G01 - MEASURING TESTING
Information Patent Application
Method for Testing Semiconductor Dies
- Publication number 20160356839
- Publication date Dec 8, 2016
- INFINEON TECHNOLOGIES AG
- Erwin Thalmann
- G01 - MEASURING TESTING
Information Patent Application
Probe Card and Method for Performing an Unclamped Inductive Switchi...
- Publication number 20160041220
- Publication date Feb 11, 2016
- Infineon Technologies Austria AG
- Michael Leutschacher
- G01 - MEASURING TESTING
Information Patent Application
Method for Testing Semiconductor Dies and a Test Apparatus
- Publication number 20150377954
- Publication date Dec 31, 2015
- INFINEON TECHNOLOGIES AG
- Erwin Thalmann
- G01 - MEASURING TESTING