MICHAEL LEV

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Yokneam, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for evaluating contact elements
- Patent number 8,577,123
- Issue date Nov 5, 2013
- Camtek Ltd.
- Roni Flieswasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for inspection
- Patent number 8,290,243
- Issue date Oct 16, 2012
- Camtek Ltd.
- Michael Lev
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND A METHOD FOR SOLDER MASK INSPECTION
- Publication number 20120244273
- Publication date Sep 27, 2012
- CAMTEK LTD
- Avi Levy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL INSPECTION SYSTEM USING MULTI-FACET IMAGING
- Publication number 20110199480
- Publication date Aug 18, 2011
- CAMTEK LTD
- Michael LEV
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION SYSTEM USING MULTI-FACET IMAGING
- Publication number 20110141267
- Publication date Jun 16, 2011
- Michael Lev
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR EVALUATING CONTACT ELEMENTS
- Publication number 20110096980
- Publication date Apr 28, 2011
- Roni Flieswasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION
- Publication number 20100245566
- Publication date Sep 30, 2010
- Camtek LTD.
- MICHAEL LEV
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETECTING CRITICAL DEFECTS
- Publication number 20090273669
- Publication date Nov 5, 2009
- Nadav WERTSMAN
- G06 - COMPUTING CALCULATING COUNTING