Michael Mater

Person

Chelsea, MI, US

People

Patents Grantslast 30 patents

Information Patent Grant
Sensing temperature of a light emitting diode
- Patent number 8,274,644
- Issue date Sep 25, 2012
- X-Rite, Inc.
- Jon K. Nisper
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for facilitating calibration of an optical in...
- Patent number 7,557,924
- Issue date Jul 7, 2009
- X-Rite, Inc.
- Jon K. Nisper
- G01 - MEASURING TESTING
Information Patent Grant
Optical instrument and parts thereof for optimally defining light p...
- Patent number 7,557,925
- Issue date Jul 7, 2009
- X-Rite, Inc.
- Jon K. Nisper
- G01 - MEASURING TESTING
Information Patent Grant
Statistical method of generating a synthetic hologram from measured...
- Patent number 7,456,976
- Issue date Nov 25, 2008
- Coherix, Inc.
- Michael J. Mater
- G01 - MEASURING TESTING
Information Patent Grant
Method of combining holograms
- Patent number 7,359,065
- Issue date Apr 15, 2008
- Coherix, Inc.
- Jon Nisper
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry method based on the wavelength drift of an illuminat...
- Patent number 7,317,541
- Issue date Jan 8, 2008
- Coherix, Inc.
- Michael J. Mater
- G01 - MEASURING TESTING
Information Patent Grant
Color measurement instrument capable of obtaining simultaneous pola...
- Patent number 6,597,454
- Issue date Jul 22, 2003
- X-Rite, Incorporated
- Bernard J. Berg
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus for multi-wavelength holographic imaging
- Publication number 20130250383
- Publication date Sep 26, 2013
- Coherix, Inc.
- Michael Mater
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Sensing Temperature Of A Light Emitting Diode
- Publication number 20100128254
- Publication date May 27, 2010
- Jon K. Nisper
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR EXAMINING A SURFACE
- Publication number 20080240510
- Publication date Oct 2, 2008
- Greg Dale
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR REDUCING CONVECTION CURRENT EFFECTS IN THE OP...
- Publication number 20080236306
- Publication date Oct 2, 2008
- Michael J. Mater
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF INTERFEROMETRIC IMAGING USING A DIGITAL MICROM...
- Publication number 20080174783
- Publication date Jul 24, 2008
- Michael J. Mater
- G02 - OPTICS
Information Patent Application
Stabilizer for vibration isolation platform
- Publication number 20080150204
- Publication date Jun 26, 2008
- Coherix, Inc
- Alex klooster
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
METHOD OF MULTIPLE WAVELENGTH INTERFEROMETRY
- Publication number 20080137098
- Publication date Jun 12, 2008
- Michael J. Mater
- G01 - MEASURING TESTING
Information Patent Application
Optical instrument and components thereof
- Publication number 20070188764
- Publication date Aug 16, 2007
- Jon K. Nisper
- G01 - MEASURING TESTING
Information Patent Application
Optical instrument
- Publication number 20070035740
- Publication date Feb 15, 2007
- Jon K. Nisper
- G01 - MEASURING TESTING
Information Patent Application
Statistical method of generating a synthetic hologram from measured...
- Publication number 20070024867
- Publication date Feb 1, 2007
- Coherix, Inc.
- Michael J. Mater
- G01 - MEASURING TESTING
Information Patent Application
Method of combining holograms
- Publication number 20070024866
- Publication date Feb 1, 2007
- Coherix, Inc.
- Jon Nisper
- G01 - MEASURING TESTING
Information Patent Application
Method for processing multiwavelength interferometric imaging data
- Publication number 20060181714
- Publication date Aug 17, 2006
- Coherix, Inc
- Michael J. Mater
- G01 - MEASURING TESTING
Information Patent Application
Object imaging system using changing frequency interferometry method
- Publication number 20050002041
- Publication date Jan 6, 2005
- Michael J. Mater
- G01 - MEASURING TESTING
Information Patent Application
Interferometry method based on changing frequency
- Publication number 20030142317
- Publication date Jul 31, 2003
- Michael J. Mater
- G01 - MEASURING TESTING

Michael Mater

Person

Patents Grantslast 30 patents

Sensing temperature of a light emitting diode

Apparatus and methods for facilitating calibration of an optical in...

Optical instrument and parts thereof for optimally defining light p...

Statistical method of generating a synthetic hologram from measured...

Method of combining holograms

Interferometry method based on the wavelength drift of an illuminat...

Color measurement instrument capable of obtaining simultaneous pola...

Patents Applicationslast 30 patents

Apparatus for multi-wavelength holographic imaging

Sensing Temperature Of A Light Emitting Diode

METHOD AND SYSTEM FOR EXAMINING A SURFACE

SYSTEM AND METHOD FOR REDUCING CONVECTION CURRENT EFFECTS IN THE OP...

SYSTEM AND METHOD OF INTERFEROMETRIC IMAGING USING A DIGITAL MICROM...

Stabilizer for vibration isolation platform

METHOD OF MULTIPLE WAVELENGTH INTERFEROMETRY

Optical instrument and components thereof

Optical instrument

Statistical method of generating a synthetic hologram from measured...

Method of combining holograms

Method for processing multiwavelength interferometric imaging data

Object imaging system using changing frequency interferometry method

Interferometry method based on changing frequency