Michael Moriarty

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Dose-based end-pointing for low-kV FIB milling in TEM sample prepar...
- Patent number 11,313,042
- Issue date Apr 26, 2022
- FEI Company
- Thomas G. Miller
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Dose-based end-pointing for low-kV FIB milling TEM sample preparation
- Patent number 10,465,293
- Issue date Nov 5, 2019
- FEI Company
- Thomas G. Miller
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Preparation of lamellae for TEM viewing
- Patent number 10,068,749
- Issue date Sep 4, 2018
- FEI Company
- Scott Edward Fuller
- G01 - MEASURING TESTING
Information Patent Grant
Method for preparing thin samples for TEM imaging
- Patent number 9,279,752
- Issue date Mar 8, 2016
- FEI Company
- Michael Moriarty
- G01 - MEASURING TESTING
Information Patent Grant
Measurement and endpointing of sample thickness
- Patent number 9,184,025
- Issue date Nov 10, 2015
- FEI Company
- Richard J. Young
- G01 - MEASURING TESTING
Information Patent Grant
Method for preparing samples for imaging
- Patent number 9,111,720
- Issue date Aug 18, 2015
- FEI Company
- Ronald Kelley
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for preparing samples for imaging
- Patent number 8,912,490
- Issue date Dec 16, 2014
- FEI Company
- Ronald Kelley
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Methods for preparing thin samples for TEM imaging
- Patent number 8,859,963
- Issue date Oct 14, 2014
- FEI Company
- Michael Moriarty
- G01 - MEASURING TESTING
Information Patent Grant
Measurement and endpointing of sample thickness
- Patent number 8,170,832
- Issue date May 1, 2012
- FEI Company
- Richard J. Young
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DOSE-BASED END-POINTING FOR LOW-KV FIB MILLING IN TEM SAMPLE PREPAR...
- Publication number 20200095688
- Publication date Mar 26, 2020
- FEI Company
- Thomas G. Miller
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR PREPARING SAMPLES FOR IMAGING
- Publication number 20150179402
- Publication date Jun 25, 2015
- FEI Company
- Ronald Kelley
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR PREPARING THIN SAMPLES FOR TEM IMAGING
- Publication number 20150102009
- Publication date Apr 16, 2015
- FEI Company
- Michael Moriarty
- G01 - MEASURING TESTING
Information Patent Application
Dose-Based End-Pointing for Low-KV FIB Milling TEM Sample Preparation
- Publication number 20140061032
- Publication date Mar 6, 2014
- FEI Company
- Thomas G. Miller
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PREPARATION OF LAMELLAE FOR TEM VIEWING
- Publication number 20130319849
- Publication date Dec 5, 2013
- FEI Company
- Scott Edward Fuller
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR PREPARING THIN SAMPLES FOR TEM IMAGING
- Publication number 20130143412
- Publication date Jun 6, 2013
- FEI Company
- Michael Moriarty
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT AND ENDPOINTING OF SAMPLE THICKNESS
- Publication number 20120187285
- Publication date Jul 26, 2012
- FEI Company
- RICHARD J. YOUNG
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT AND ENDPOINTING OF SAMPLE THICKNESS
- Publication number 20100116977
- Publication date May 13, 2010
- FEI Company
- Richard J. Young
- G01 - MEASURING TESTING

Michael Moriarty

Person

Patents Grantslast 30 patents

Dose-based end-pointing for low-kV FIB milling in TEM sample prepar...

Dose-based end-pointing for low-kV FIB milling TEM sample preparation

Preparation of lamellae for TEM viewing

Method for preparing thin samples for TEM imaging

Measurement and endpointing of sample thickness

Method for preparing samples for imaging

Method for preparing samples for imaging

Methods for preparing thin samples for TEM imaging

Measurement and endpointing of sample thickness

Patents Applicationslast 30 patents

DOSE-BASED END-POINTING FOR LOW-KV FIB MILLING IN TEM SAMPLE PREPAR...

METHOD FOR PREPARING SAMPLES FOR IMAGING

METHOD FOR PREPARING THIN SAMPLES FOR TEM IMAGING

Dose-Based End-Pointing for Low-KV FIB Milling TEM Sample Preparation

PREPARATION OF LAMELLAE FOR TEM VIEWING

METHODS FOR PREPARING THIN SAMPLES FOR TEM IMAGING

MEASUREMENT AND ENDPOINTING OF SAMPLE THICKNESS

MEASUREMENT AND ENDPOINTING OF SAMPLE THICKNESS