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Michael Naumann
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Chandler, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Three-axis microelectromechanical systems devices
Patent number
10,031,156
Issue date
Jul 24, 2018
NXP USA, INC.
Michael Naumann
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Pressure sensor with variable sense gap
Patent number
9,846,097
Issue date
Dec 19, 2017
NXP USA, INC.
Michael Naumann
G01 - MEASURING TESTING
Information
Patent Grant
Microelectromechanical systems devices with improved lateral sensit...
Patent number
9,612,254
Issue date
Apr 4, 2017
NXP USA, INC.
Michael Naumann
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Shock sensor with latch mechanism and method of shock detection
Patent number
9,562,825
Issue date
Feb 7, 2017
NXP USA, INC.
Michael Naumann
G01 - MEASURING TESTING
Information
Patent Grant
Three-axis microelectromechanical systems device with single proof...
Patent number
9,360,496
Issue date
Jun 7, 2016
FREESCALE SEMICONDUCTOR, INC.
Michael Naumann
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
CONTROLLED PULSE GENERATION METHODS AND APPARATUSES FOR EVALUATING...
Publication number
20170370799
Publication date
Dec 28, 2017
Freescale Semiconductor Inc.
PETER T. JONES
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
PRESSURE SENSOR WITH VARIABLE SENSE GAP
Publication number
20170122825
Publication date
May 4, 2017
FREESCALE SEMICONDUCTOR, INC.
MICHAEL NAUMANN
G01 - MEASURING TESTING
Information
Patent Application
MEMS SENSOR WITH REDUCED CROSS-AXIS SENSITIVITY
Publication number
20170089945
Publication date
Mar 30, 2017
FREESCALE SEMICONDUCTOR, INC.
MICHAEL NAUMANN
G01 - MEASURING TESTING
Information
Patent Application
MEMS DEVICE WITH FLEXIBLE TRAVEL STOPS AND METHOD OF FABRICATION
Publication number
20170023606
Publication date
Jan 26, 2017
FREESCALE SEMICONDUCTOR, INC.
MICHAEL NAUMANN
G01 - MEASURING TESTING
Information
Patent Application
INERTIAL SENSOR WITH COUPLE SPRING FOR COMMON MODE REJECTION
Publication number
20160370180
Publication date
Dec 22, 2016
FREESCALE SEMICONDUCTOR, INC.
MICHAEL NAUMANN
G01 - MEASURING TESTING
Information
Patent Application
SHOCK SENSOR WITH LATCH MECHANISM AND METHOD OF SHOCK DETECTION
Publication number
20160131552
Publication date
May 12, 2016
FREESCALE SEMICONDUCTOR, INC.
MICHAEL NAUMANN
G01 - MEASURING TESTING
Information
Patent Application
THREE-AXIS MICROELECTROMECHANICAL SYSTEMS DEVICE WITH SINGLE PROOF...
Publication number
20160097792
Publication date
Apr 7, 2016
FREESCALE SEMICONDUCTOR, INC.
Michael NAUMANN
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
THREE-AXIS MICROELECTROMECHANICAL SYSTEMS DEVICES
Publication number
20160084872
Publication date
Mar 24, 2016
FREESCALE SEMICONDUCTOR, INC.
Michael NAUMANN
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MICROELECTROMECHANICAL SYSTEMS DEVICES WITH IMPROVED LATERAL SENSIT...
Publication number
20150375989
Publication date
Dec 31, 2015
FREESCALE SEMICONDUCTOR, INC.
Michael NAUMANN
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SENSOR WITH COMBINED SENSE ELEMENTS FOR MULTIPLE AXIS SENSING
Publication number
20150268269
Publication date
Sep 24, 2015
FREESCALE SEMICONDUCTOR, INC.
Kemiao Jia
B81 - MICRO-STRUCTURAL TECHNOLOGY