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Michael Nolan Jervis
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McKinney, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Bondwire testing of IC using pin diode signatures
Patent number
10,670,649
Issue date
Jun 2, 2020
Texas Instruments Incorporated
Ronald Andrew Michallick
G01 - MEASURING TESTING
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Patent Grant
Reduced-impedance active current measurement
Patent number
10,014,810
Issue date
Jul 3, 2018
Texas Instruments Incorporated
Ronald Andrew Michallick
H03 - BASIC ELECTRONIC CIRCUITRY
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Patent Grant
Defect detection in integrated circuit devices
Patent number
8,947,118
Issue date
Feb 3, 2015
Texas Instruments Incorporated
Ronald Andrew Michallick
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
BONDWIRE TESTING OF IC USING PIN DIODE SIGNATURES
Publication number
20190242940
Publication date
Aug 8, 2019
TEXAS INSTRUMENTS INCORPORATED
RONALD ANDREW MICHALLICK
G01 - MEASURING TESTING
Information
Patent Application
DEFECT DETECTION IN INTEGRATED CIRCUIT DEVICES
Publication number
20130207686
Publication date
Aug 15, 2013
TEXAS INSTRUMENTS INCORPORATED
Ronald Andrew Michallick
G01 - MEASURING TESTING