Michael P. Baker

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Round Rock, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for speeding up serial data tolerance testing
- Patent number 8,006,141
- Issue date Aug 23, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Samuel G. Stephens
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for electrical testing
- Patent number 7,777,509
- Issue date Aug 17, 2010
- FREESCALE SEMICONDUCTOR, INC.
- David E. Halter
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for Speeding Up Serial Data Tolerance Testing
- Publication number 20100332931
- Publication date Dec 30, 2010
- Samuel G. Stephens
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ELECTRICAL TESTING
- Publication number 20090267624
- Publication date Oct 29, 2009
- David E. Halter
- G01 - MEASURING TESTING