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Michael P. Ellengogen
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Wayland, MA, US
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Patents Grants
last 30 patents
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Patent Grant
X-ray inspection system
Patent number
6,968,034
Issue date
Nov 22, 2005
L-3 Communications Security and Detection Systems, Inc.
Michael P. Ellengogen
G01 - MEASURING TESTING
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Patent Grant
X-ray inspection system
Patent number
6,856,667
Issue date
Feb 15, 2005
L-3 Communications Security and Detection Systems Corporation Delaware
Michael P. Ellengogen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
X-ray inspection system
Publication number
20020172324
Publication date
Nov 21, 2002
Michael P. Ellengogen
G01 - MEASURING TESTING