Michael P. Ellengogen

Person

  • Wayland, MA, US

Patents Grantslast 30 patents

  • Information Patent Grant

    X-ray inspection system

    • Patent number 6,968,034
    • Issue date Nov 22, 2005
    • L-3 Communications Security and Detection Systems, Inc.
    • Michael P. Ellengogen
    • G01 - MEASURING TESTING
  • Information Patent Grant

    X-ray inspection system

    • Patent number 6,856,667
    • Issue date Feb 15, 2005
    • L-3 Communications Security and Detection Systems Corporation Delaware
    • Michael P. Ellengogen
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    X-ray inspection system

    • Publication number 20020172324
    • Publication date Nov 21, 2002
    • Michael P. Ellengogen
    • G01 - MEASURING TESTING