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Michael P. MURPHY
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Cleveland, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Light scattering detectors and sample cells for the same
Patent number
12,019,016
Issue date
Jun 25, 2024
Tosoh Corporation
Max Haney
G01 - MEASURING TESTING
Information
Patent Grant
Light scattering detectors and methods for the same
Patent number
12,019,007
Issue date
Jun 25, 2024
Tosoh Corporation
Max Haney
G01 - MEASURING TESTING
Information
Patent Grant
Methods of determining radius of gyration of a particle using light...
Patent number
11,674,880
Issue date
Jun 13, 2023
M & J Scientific, LLC
Max Haney
G01 - MEASURING TESTING
Information
Patent Grant
Light scattering detectors and sample cells for the same
Patent number
11,226,287
Issue date
Jan 18, 2022
M & J Scientific, LLC
Max Haney
G01 - MEASURING TESTING
Information
Patent Grant
Light scattering detectors and methods for the same
Patent number
11,150,175
Issue date
Oct 19, 2021
M & J Scientific, LLC
Max Haney
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LIGHT SCATTERING DETECTORS AND METHODS FOR THE SAME
Publication number
20230273109
Publication date
Aug 31, 2023
TOSOH CORPORATION
Max HANEY
G01 - MEASURING TESTING
Information
Patent Application
LIGHT SCATTERING DETECTORS AND SAMPLE CELLS FOR THE SAME
Publication number
20220107270
Publication date
Apr 7, 2022
M & J Scientific, LLC
Max HANEY
G01 - MEASURING TESTING
Information
Patent Application
LIGHT SCATTERING DETECTORS AND METHODS FOR THE SAME
Publication number
20210404941
Publication date
Dec 30, 2021
M & J Scientific, LLC
Max HANEY
G01 - MEASURING TESTING
Information
Patent Application
LIGHT SCATTERING DETECTORS AND SAMPLE CELLS FOR THE SAME
Publication number
20210223172
Publication date
Jul 22, 2021
M & J Scientific, LLC
Max HANEY
G01 - MEASURING TESTING
Information
Patent Application
LIGHT SCATTERING DETECTORS AND METHODS FOR THE SAME
Publication number
20210223160
Publication date
Jul 22, 2021
M & J Scientific, LLC
Max HANEY
G01 - MEASURING TESTING