Michael R. Allen

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Boise, ID, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for optimizing probe card design
- Patent number 7,355,423
- Issue date Apr 8, 2008
- Micron Technology, Inc.
- Brooklin J. Gore
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETECTION OF PRINT MATERIAL DENSITY ABNORMALITIES
- Publication number 20210294256
- Publication date Sep 23, 2021
- Hewlett-Packard Development Company, L.P.
- Michael Kenneth Allen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR OPTIMIZING PROBE CARD DESIGN
- Publication number 20070296438
- Publication date Dec 27, 2007
- Brooklin J. Gore
- G01 - MEASURING TESTING