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Cell breakdown
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Patent number 4,525,666
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Issue date Jun 25, 1985
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Coulter Electronics, Inc.
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Michael R. Groves
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G01 - MEASURING TESTING
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Focused aperture module
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Patent number 4,395,676
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Issue date Jul 26, 1983
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Coulter Electronics, Inc.
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John D. Hollinger
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G01 - MEASURING TESTING
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Particle shape determination
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Patent number 4,298,836
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Issue date Nov 3, 1981
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Coulter Electronics, Inc.
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Michael R. Groves
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G01 - MEASURING TESTING