Michael Reading

Follow

Person

Norwich, GB

People

Patents Grantslast 30 patents

Information Patent Grant
High frequency deflection measurement of IR absorption
- Patent number 8,607,622
- Issue date Dec 17, 2013
- Anasys Instruments Corporation
- Alexandre Dazzi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High frequency deflection measurement of IR absorption
- Patent number 8,418,538
- Issue date Apr 16, 2013
- Anasys Instruments Inc.
- A. Dazzi Dazzi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High frequency deflection measurement of IR absorption
- Patent number 8,402,819
- Issue date Mar 26, 2013
- Anasys Instruments, Inc.
- A. Dazzi Dazzi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Transition temperature microscopy
- Patent number 8,177,422
- Issue date May 15, 2012
- Anasys Instruments
- Kevin Kjoller
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High frequency deflection measurement of IR absorption
- Patent number 8,001,830
- Issue date Aug 23, 2011
- Anasys Instruments, Inc.
- Alexandre Dazzi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe with embedded heater for nanoscale analysis
- Patent number 7,497,613
- Issue date Mar 3, 2009
- Anasys Instruments
- William P. King
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High frequency deflection measurement of IR absorption
- Publication number 20110283428
- Publication date Nov 17, 2011
- A. Dazzi Dazzi
- G01 - MEASURING TESTING
Information Patent Application
Transition temperature microscopy
- Publication number 20100042356
- Publication date Feb 18, 2010
- Kevin Kjoller
- G01 - MEASURING TESTING
Information Patent Application
Probe with embedded heater for nanoscale analysis
- Publication number 20060254345
- Publication date Nov 16, 2006
- William P. King
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for localized infrared spectrocopy and micro-t...
- Publication number 20060222047
- Publication date Oct 5, 2006
- Michael Reading
- G01 - MEASURING TESTING