Michael RUF

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Madison, WI, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of conducting an X-ray diffraction-based crystallography ana...
- Patent number 9,372,163
- Issue date Jun 21, 2016
- Michael Ruf
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
A SYSTEM AND METHOD FOR DIFFRACTION-BASED STRUCTURE DETERMINATION W...
- Publication number 20220187226
- Publication date Jun 16, 2022
- Bruker AXS, LLC
- Luc BOURHIS
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CONDUCTING AN X-RAY DIFFRACTION-BASED CRYSTALLOGRAPHY ANA...
- Publication number 20150276629
- Publication date Oct 1, 2015
- Bruker AXS, Inc.
- Michael RUF
- G01 - MEASURING TESTING