Michael S. Hagen

Person

Vancouver, WA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Test and measurement instrument with an automatic threshold control
- Patent number 8,228,072
- Issue date Jul 24, 2012
- Tektronix, Inc.
- Michael S. Hagen
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement instrument and method of configuring using a s...
- Patent number 8,089,293
- Issue date Jan 3, 2012
- Tektronix, Inc.
- Michael S. Hagen
- G01 - MEASURING TESTING
Information Patent Grant
Trace delay error compensation
- Patent number 7,634,747
- Issue date Dec 15, 2009
- Tektronix, Inc.
- Michael S. Hagen
- G01 - MEASURING TESTING
Information Patent Grant
Logic analyzer using a digital filter
- Patent number 7,526,395
- Issue date Apr 28, 2009
- Tektronix, Inc.
- Steven K. Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Hyperfine oversampler method and apparatus
- Patent number 7,315,593
- Issue date Jan 1, 2008
- Tektronix, Inc.
- Michael S. Hagen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three dimensional correlated data display
- Patent number 7,236,900
- Issue date Jun 26, 2007
- Tektronix, Inc.
- Michael S. Hagen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data transformation for the reduction of power and noise in CMOS st...
- Patent number 6,938,172
- Issue date Aug 30, 2005
- Tektronix, Inc.
- Michael S. Hagen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus for wire-or bus expansion between two instrument chassis
- Patent number 6,704,830
- Issue date Mar 9, 2004
- Tektronix, Inc.
- Kevin C. Spisak
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for data bus expansion between two instrument chassis
- Patent number 6,640,273
- Issue date Oct 28, 2003
- Tektronix, Inc.
- Kevin C. Spisak
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for acquiring a signal from an intermediate point on a se...
- Patent number 6,624,721
- Issue date Sep 23, 2003
- Tektronix, Inc.
- Michael S. Hagen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Programmable digital multiple event generator
- Patent number 4,839,841
- Issue date Jun 13, 1989
- Tektronix, Inc.
- Michael S. Hagen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus including a programmable set-up and hold feature
- Patent number 4,541,100
- Issue date Sep 10, 1985
- Tektronix, Inc.
- Steven R. Sutton
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TEST AND MEASUREMENT INSTRUMENT WITH AN AUTOMATIC THRESHOLD CONTROL
- Publication number 20100271075
- Publication date Oct 28, 2010
- Tektronix, Inc.
- Michael S. Hagen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT AND METHOD OF CONFIGURING USING A S...
- Publication number 20100264946
- Publication date Oct 21, 2010
- Tektronix, Inc.
- Michael S. HAGEN
- G01 - MEASURING TESTING
Information Patent Application
LOGIC ANALYZER USING A DIGITAL FILTER
- Publication number 20090063072
- Publication date Mar 5, 2009
- Tektronix, Inc.
- Steven K. SULLIVAN
- G01 - MEASURING TESTING
Information Patent Application
TRACE DELAY ERROR COMPENSATION
- Publication number 20080007712
- Publication date Jan 10, 2008
- Tektronix, Inc.
- Michael S. Hagen
- G01 - MEASURING TESTING
Information Patent Application
Three-dimensional correlated data display
- Publication number 20050234670
- Publication date Oct 20, 2005
- Michael S. Hagen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Hyperfine oversampler method and apparatus
- Publication number 20040223569
- Publication date Nov 11, 2004
- Michael S. Hagen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Data transformation for the reduction of power and noise in CMOS st...
- Publication number 20020163359
- Publication date Nov 7, 2002
- Michael S. Hagen
- H03 - BASIC ELECTRONIC CIRCUITRY

Michael S. Hagen

Person

Patents Grantslast 30 patents

Test and measurement instrument with an automatic threshold control

Test and measurement instrument and method of configuring using a s...

Trace delay error compensation

Logic analyzer using a digital filter

Hyperfine oversampler method and apparatus

Three dimensional correlated data display

Data transformation for the reduction of power and noise in CMOS st...

Apparatus for wire-or bus expansion between two instrument chassis

Apparatus for data bus expansion between two instrument chassis

Apparatus for acquiring a signal from an intermediate point on a se...

Programmable digital multiple event generator

Apparatus including a programmable set-up and hold feature

Patents Applicationslast 30 patents

TEST AND MEASUREMENT INSTRUMENT WITH AN AUTOMATIC THRESHOLD CONTROL

TEST AND MEASUREMENT INSTRUMENT AND METHOD OF CONFIGURING USING A S...

LOGIC ANALYZER USING A DIGITAL FILTER

TRACE DELAY ERROR COMPENSATION

Three-dimensional correlated data display

Hyperfine oversampler method and apparatus

Data transformation for the reduction of power and noise in CMOS st...