Michael S. Heutmaker

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Trenton, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for correcting phase and amplitude imbalances of...
- Patent number 6,512,800
- Issue date Jan 28, 2003
- Lucent Technologies Inc.
- Israel Amir
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and system for DC offset correction of a quadrature modulate...
- Patent number 6,434,204
- Issue date Aug 13, 2002
- Lucent Technologies Inc.
- Israel Amir
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for testing RF devices
- Patent number 5,581,190
- Issue date Dec 3, 1996
- Lucent Technologies Inc.
- Chauncey Herring
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for integrated testing of a system containing...
- Patent number 5,481,186
- Issue date Jan 2, 1996
- AT&T Corp.
- Michael S. Heutmaker
- G01 - MEASURING TESTING
Information Patent Grant
Optical probing method and apparatus
- Patent number 5,126,660
- Issue date Jun 30, 1992
- AT&T Bell Laboratories
- George T. Harvey
- G01 - MEASURING TESTING
Information Patent Grant
Optical probing method and apparatus
- Patent number 5,126,661
- Issue date Jun 30, 1992
- AT&T Bell Laboratories
- George T. Harvey
- G01 - MEASURING TESTING
Information Patent Grant
Amplitude noise reduction for optically pumped modelocked lasers
- Patent number 5,042,040
- Issue date Aug 20, 1991
- AT&T Bell Laboratories
- George T. Harvey
- H01 - BASIC ELECTRIC ELEMENTS