Michael S. Hsiao

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Blacksburg, VA, US

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Patents Grantslast 30 patents

Information Patent Grant
Automated program synthesis from natural language for domain specif...
- Patent number 10,843,080
- Issue date Nov 24, 2020
- Virginia Tech Intellectual Properties, Inc.
- Michael S. Hsiao
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Method and apparatus for testing 3D integrated circuits
- Patent number 8,522,096
- Issue date Aug 27, 2013
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Decision selection and associated learning for computing all soluti...
- Patent number 7,356,747
- Issue date Apr 8, 2008
- Virginia Tech Intellectual Properties, Inc.
- Michael S. Hsiao
- G01 - MEASURING TESTING
Information Patent Grant
Generating a test sequence using a satisfiability technique
- Patent number 7,076,712
- Issue date Jul 11, 2006
- Fujitsu Limited
- Mukul R. Prasad
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED PROGRAM SYNTHESIS FROM NATURAL LANGUAGE FOR DOMAIN SPECIF...
- Publication number 20170239576
- Publication date Aug 24, 2017
- Virginia Tech Intellectual Properties, Inc.
- Michael S. Hsiao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING 3D INTEGRATED CIRCUITS
- Publication number 20120110402
- Publication date May 3, 2012
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DELAY FAULT COVERAGE ENHANCEMENT
- Publication number 20100138709
- Publication date Jun 3, 2010
- Laung-Terng WANG
- G01 - MEASURING TESTING
Information Patent Application
Decision selection and associated learning for computing all soluti...
- Publication number 20060031730
- Publication date Feb 9, 2006
- Michael S. Hsiao
- G01 - MEASURING TESTING
Information Patent Application
Generating a test sequence using a satisfiability technique
- Publication number 20040237012
- Publication date Nov 25, 2004
- FUJITSU LIMITED
- Mukul R. Prasad
- G01 - MEASURING TESTING