Michael S. McIntyre

Person

Autsin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for analysis of continuous data using binary p...
- Patent number 8,239,151
- Issue date Aug 7, 2012
- Advanced Micro Devices, Inc.
- Michael G. McIntyre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining die test protocols based on process health
- Patent number 8,041,518
- Issue date Oct 18, 2011
- GLOBALFOUNDRIES Inc.
- Michael G. McIntyre
- G01 - MEASURING TESTING
Information Patent Grant
Automated recovery from a split segment condition in a layer2 netwo...
- Patent number 7,990,849
- Issue date Aug 2, 2011
- Hewlett-Packard Development Company, L.P.
- Michael Sean McGee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for analysis of continuous data using binary p...
- Patent number 7,899,634
- Issue date Mar 1, 2011
- Advanced Micro Devices, Inc.
- Michael G. McIntyre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for implementing scaled device tests
- Patent number 7,822,567
- Issue date Oct 26, 2010
- Advanced Micro Devices, Inc.
- Kevin R. Lensing
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for relative testing of integrated circuit dev...
- Patent number 7,710,137
- Issue date May 4, 2010
- GLOBALFOUNDRIES Inc.
- Michael G. McIntyre
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for monitoring network connectivity
- Patent number 7,639,624
- Issue date Dec 29, 2009
- Hewlett-Packard Development Company, L.P.
- Michel Sean McGee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for manufacturing data indexing
- Patent number 7,583,833
- Issue date Sep 1, 2009
- Advanced Micro Devices, Inc.
- Michael G. McIntyre
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for implementing a universal coordinate system...
- Patent number 7,539,552
- Issue date May 26, 2009
- Advanced Micro Devices, Inc.
- Michael G. McIntyre
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for identifying outlier data
- Patent number 7,533,313
- Issue date May 12, 2009
- Advanced Micro Devices, Inc.
- Michael Alan Retersdorf
- G01 - MEASURING TESTING
Information Patent Grant
Network controller
- Patent number 7,426,189
- Issue date Sep 16, 2008
- Hewlett-Packard Development Company, L.P.
- Michael S. McGee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data representation relating to a non-sampled workpiece
- Patent number 7,236,848
- Issue date Jun 26, 2007
- Advanced Micro Devices, Inc.
- Steven P. Reeves
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Split manufacturing method for advanced semiconductor circuits
- Patent number 7,195,931
- Issue date Mar 27, 2007
- Advanced Micro Devices, Inc.
- Richard Wayne Jarvis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Universal spatial pattern recognition system
- Patent number 7,106,897
- Issue date Sep 12, 2006
- Advanced Micro Devices, Inc.
- Michael G. McIntyre
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Generating an alarm based on location and time
- Patent number 6,943,671
- Issue date Sep 13, 2005
- Hewlett-Packard Development Company, L.P.
- Michael Sean McGee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated defect monitor structures for conductive features on a s...
- Patent number 6,362,634
- Issue date Mar 26, 2002
- Advanced Micro Devices, Inc.
- Richard W. Jarvis
- G01 - MEASURING TESTING
Information Patent Grant
Multipurpose defect test structure with switchable voltage contrast...
- Patent number 6,297,644
- Issue date Oct 2, 2001
- Advanced Micro Devices, Inc.
- Richard W. Jarvis
- G01 - MEASURING TESTING
Information Patent Grant
Device level identification methodology
- Patent number 6,063,685
- Issue date May 16, 2000
- Advanced Micro Devices, Inc.
- Paul J. Steffan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for recognizing scratch patterns on semiconductor...
- Patent number 5,913,105
- Issue date Jun 15, 1999
- Michael McIntyre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for transmitting a message from a computer sys...
- Patent number 5,638,517
- Issue date Jun 10, 1997
- International Business Machines Corp.
- Brice A. Bartek
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR ANALYSIS OF CONTINOUS DATA USING BINARY PA...
- Publication number 20110137597
- Publication date Jun 9, 2011
- Michael G. McIntyre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR RELATIVE TESTING OF INTEGRATED CIRCUIT DEV...
- Publication number 20090058444
- Publication date Mar 5, 2009
- MICHAEL G. MCINTYRE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR IMPLEMENTING SCALED DEVICE TESTS
- Publication number 20090006021
- Publication date Jan 1, 2009
- Kevin R. Lensing
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING DIE TEST PROTOCOLS BASED ON PROCESS HEALTH
- Publication number 20080281545
- Publication date Nov 13, 2008
- Michael G. McIntyre
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Implementing a Universal Coordinate System...
- Publication number 20080147222
- Publication date Jun 19, 2008
- Michael G. McIntyre
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for manufacturing data indexing
- Publication number 20070179663
- Publication date Aug 2, 2007
- Michael G. McIntyre
- G05 - CONTROLLING REGULATING
Information Patent Application
Data representation relating to a non-sampled workpiece
- Publication number 20070061032
- Publication date Mar 15, 2007
- Steven P. Reeves
- G05 - CONTROLLING REGULATING
Information Patent Application
Dynamic allocation and configuration of a computer system's network...
- Publication number 20060029097
- Publication date Feb 9, 2006
- Michael Sean McGee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and system for monitoring network connectivity
- Publication number 20060018263
- Publication date Jan 26, 2006
- Michel Sean McGee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Automated recovery from a split segment condition in a layer2 netwo...
- Publication number 20050281190
- Publication date Dec 22, 2005
- Michael Sean McGee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Network controller
- Publication number 20050038878
- Publication date Feb 17, 2005
- Michael S. McGee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Generating an alarm based on location and time
- Publication number 20040207522
- Publication date Oct 21, 2004
- Michael Sean McGee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Split manufacturing method for advanced semiconductor circuits
- Publication number 20040102019
- Publication date May 27, 2004
- Richard Wayne Jarvis
- H01 - BASIC ELECTRIC ELEMENTS

Michael S. McIntyre

Person

Patents Grantslast 30 patents

Method and apparatus for analysis of continuous data using binary p...

Determining die test protocols based on process health

Automated recovery from a split segment condition in a layer2 netwo...

Method and apparatus for analysis of continuous data using binary p...

Method and apparatus for implementing scaled device tests

Method and apparatus for relative testing of integrated circuit dev...

Method and system for monitoring network connectivity

Method and apparatus for manufacturing data indexing

Method and apparatus for implementing a universal coordinate system...

Method and apparatus for identifying outlier data

Network controller

Data representation relating to a non-sampled workpiece

Split manufacturing method for advanced semiconductor circuits

Universal spatial pattern recognition system

Generating an alarm based on location and time

Integrated defect monitor structures for conductive features on a s...

Multipurpose defect test structure with switchable voltage contrast...

Device level identification methodology

Method and system for recognizing scratch patterns on semiconductor...

Method and apparatus for transmitting a message from a computer sys...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR ANALYSIS OF CONTINOUS DATA USING BINARY PA...

METHOD AND APPARATUS FOR RELATIVE TESTING OF INTEGRATED CIRCUIT DEV...

METHOD AND APPARATUS FOR IMPLEMENTING SCALED DEVICE TESTS

DETERMINING DIE TEST PROTOCOLS BASED ON PROCESS HEALTH

Method and Apparatus for Implementing a Universal Coordinate System...

Method and apparatus for manufacturing data indexing

Data representation relating to a non-sampled workpiece

Dynamic allocation and configuration of a computer system's network...

Method and system for monitoring network connectivity

Automated recovery from a split segment condition in a layer2 netwo...

Network controller

Generating an alarm based on location and time

Split manufacturing method for advanced semiconductor circuits