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Michael Samaniego
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Ulm, DE
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Patents Grants
last 30 patents
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Patent Grant
Measurement apparatus for measuring a wavefront aberration of an im...
Patent number
11,441,970
Issue date
Sep 13, 2022
Carl Zeiss SMT GmbH
Albrecht Ehrmann
G02 - OPTICS
Information
Patent Grant
Method and device for calibrating a diffractive measuring structure
Patent number
11,391,643
Issue date
Jul 19, 2022
Carl Zeiss SMT GmbH
Michael Samaniego
G01 - MEASURING TESTING
Information
Patent Grant
Appliance for the moiré measurement of an optical test object
Patent number
10,996,566
Issue date
May 4, 2021
Carl Zeiss SMT GmbH
Michael Samaniego
G02 - OPTICS
Information
Patent Grant
Measuring system for measuring an imaging quality of an EUV lens
Patent number
9,494,483
Issue date
Nov 15, 2016
Carl Zeiss SMT GmbH
Ralf Frese
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND DEVICE FOR CALIBRATING A DIFFRACTIVE MEASURING STRUCTURE
Publication number
20200284689
Publication date
Sep 10, 2020
Carl Zeiss SMT GMBH
Michael SAMANIEGO
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT APPARATUS FOR MEASURING A WAVEFRONT ABERRATION OF AN IM...
Publication number
20200003655
Publication date
Jan 2, 2020
Carl Zeiss SMT GMBH
Albrecht EHRMANN
G02 - OPTICS
Information
Patent Application
APPLIANCE FOR THE MOIRÉ MEASUREMENT OF AN OPTICAL TEST OBJECT
Publication number
20190187564
Publication date
Jun 20, 2019
Carl Zeiss SMT GMBH
Michael SAMANIEGO
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
DEVICE AND METHOD FOR MOIRÉ MEASUREMENT OF AN OPTICAL TEST SPECIMEN
Publication number
20190003922
Publication date
Jan 3, 2019
Carl Zeiss SMT GMBH
Michael Samaniego
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Measuring System for Measuring an Imaging Quality of an EUV Lens
Publication number
20150009492
Publication date
Jan 8, 2015
Carl Zeiss SMT GMBH
Ralf Frese
G01 - MEASURING TESTING