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Michael Schar
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Zurich, CH
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last 30 patents
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Patent Grant
Measuring method of spatially resolved frequency selective images
Patent number
7,167,003
Issue date
Jan 23, 2007
Universitat Zurich
Kai Eberhardt
G01 - MEASURING TESTING
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last 30 patents
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Measuring method of spatially resolved frequency selective images
Publication number
20060043971
Publication date
Mar 2, 2006
Universitat Zurich and Eidgenossische Technische Hochschule (E T H)
Kai Eberhardt
G01 - MEASURING TESTING