Michael Schittenhelm

Person

Poing, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Circuit arrangement and method for driving electronic chips
- Patent number 7,426,669
- Issue date Sep 16, 2008
- Infineon Technologies AG
- Björn Flach
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit for testing a synchronous memory circuit
- Patent number 7,117,404
- Issue date Oct 3, 2006
- Infineon Technologies AG
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and device for generating digital signal patterns
- Patent number 7,117,403
- Issue date Oct 3, 2006
- Infineon Technologies AG
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
System for testing fast synchronous digital circuits, particularly...
- Patent number 7,062,690
- Issue date Jun 13, 2006
- Infineon Technologies AG
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
Address generator for generating addresses for testing a circuit
- Patent number 6,957,373
- Issue date Oct 18, 2005
- Infineon Technologies AG
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing wafers to be tested and calibration apparatus
- Patent number 6,897,646
- Issue date May 24, 2005
- Infineon Technologies AG
- Thomas Grebner
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for reading and for checking the time position of...
- Patent number 6,871,306
- Issue date Mar 22, 2005
- Infineon Technologies AG
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
Test data generator
- Patent number 6,865,707
- Issue date Mar 8, 2005
- Infineon Technologies AG
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
Address counter for addressing synchronous high-frequency digital c...
- Patent number 6,862,702
- Issue date Mar 1, 2005
- Infineon Technologies AG
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit configuration for generating control signals for testing hi...
- Patent number 6,839,397
- Issue date Jan 4, 2005
- Infineon Technologies AG
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit
- Patent number 6,744,272
- Issue date Jun 1, 2004
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of calibrating a test system for semiconductor components, a...
- Patent number 6,724,181
- Issue date Apr 20, 2004
- Infineon Technologies AG
- Michael Schittenhelm
- G01 - MEASURING TESTING
Information Patent Grant
System for testing fast integrated digital circuits, in particular...
- Patent number 6,721,904
- Issue date Apr 13, 2004
- Infineon Technologies AG
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit for testing a circuit
- Patent number 6,618,305
- Issue date Sep 9, 2003
- Infineon Technologies AG
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
System for testing fast synchronous semiconductor circuits
- Patent number 6,556,492
- Issue date Apr 29, 2003
- Infineon Technologies AG
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Grant
Field-effect-controlled transistor and method for fabricating the t...
- Patent number 6,515,319
- Issue date Feb 4, 2003
- Infineon Technologies AG
- Dietrich Widmann
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20090085596
- Publication date Apr 2, 2009
- QIMONDA AG
- Wolfgang Ruf
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device test method and device
- Publication number 20070132475
- Publication date Jun 14, 2007
- Ana Maria Sa Carneiro Leao
- G01 - MEASURING TESTING
Information Patent Application
Circuit arrangement and method for driving electronic chips
- Publication number 20050138491
- Publication date Jun 23, 2005
- Infineon Technologies AG
- Bjorn Flach
- G01 - MEASURING TESTING
Information Patent Application
Method for testing wafers to be tested and calibration apparatus
- Publication number 20030076126
- Publication date Apr 24, 2003
- Thomas Grebner
- G01 - MEASURING TESTING
Information Patent Application
Test circuit for testing a synchronous memory circuit
- Publication number 20030005361
- Publication date Jan 2, 2003
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Application
Test circuit for testing a synchronous circuit
- Publication number 20030005389
- Publication date Jan 2, 2003
- Wolfgang Ernst
- G01 - MEASURING TESTING
Information Patent Application
Test circuit for testing a circuit
- Publication number 20020196688
- Publication date Dec 26, 2002
- Infineon Technologies AG
- Wolfgang Ernst
- G01 - MEASURING TESTING
Information Patent Application
Test circuit
- Publication number 20020171447
- Publication date Nov 21, 2002
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Application
Address generator for generating addresses for testing a circuit
- Publication number 20020170012
- Publication date Nov 14, 2002
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Application
Method and device for reading and for checking the time position of...
- Publication number 20020160558
- Publication date Oct 31, 2002
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Application
Test data generator
- Publication number 20020157052
- Publication date Oct 24, 2002
- Infineon Technologies AG
- Wolfgang Ernst
- G01 - MEASURING TESTING
Information Patent Application
Method of calibrating a test system for semiconductor components, a...
- Publication number 20020075030
- Publication date Jun 20, 2002
- Michael Schittenhelm
- G01 - MEASURING TESTING
Information Patent Application
System for testing fast synchronous digital circuits, particularly...
- Publication number 20020070748
- Publication date Jun 13, 2002
- Wolfgang Ernst
- G01 - MEASURING TESTING
Information Patent Application
Field-effect-controlled transistor and method for fabricating the t...
- Publication number 20020014669
- Publication date Feb 7, 2002
- Dietrich Widmann
- B82 - NANO-TECHNOLOGY
Information Patent Application
Address counter for addressing synchronous high-frequency digital c...
- Publication number 20020012286
- Publication date Jan 31, 2002
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Application
System for testing fast synchronous semiconductor circuits
- Publication number 20020012283
- Publication date Jan 31, 2002
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Application
System for testing fast integrated digital circuits, in particular...
- Publication number 20020010877
- Publication date Jan 24, 2002
- Wolfgang Ernst
- G11 - INFORMATION STORAGE
Information Patent Application
Method and device for generating digital signal patterns
- Publication number 20020009007
- Publication date Jan 24, 2002
- Wolfgang Ernst
- G01 - MEASURING TESTING
Information Patent Application
Circuit configuration for generating control signals for testing hi...
- Publication number 20020010878
- Publication date Jan 24, 2002
- Wolfgang Ernst
- G11 - INFORMATION STORAGE

Michael Schittenhelm

Person

Patents Grantslast 30 patents

Circuit arrangement and method for driving electronic chips

Test circuit for testing a synchronous memory circuit

Method and device for generating digital signal patterns

System for testing fast synchronous digital circuits, particularly...

Address generator for generating addresses for testing a circuit

Method for testing wafers to be tested and calibration apparatus

Method and device for reading and for checking the time position of...

Test data generator

Address counter for addressing synchronous high-frequency digital c...

Circuit configuration for generating control signals for testing hi...

Test circuit

Method of calibrating a test system for semiconductor components, a...

System for testing fast integrated digital circuits, in particular...

Test circuit for testing a circuit

System for testing fast synchronous semiconductor circuits

Field-effect-controlled transistor and method for fabricating the t...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR TESTING SEMICONDUCTOR DEVICES

Semiconductor device test method and device

Circuit arrangement and method for driving electronic chips

Method for testing wafers to be tested and calibration apparatus

Test circuit for testing a synchronous memory circuit

Test circuit for testing a synchronous circuit

Test circuit for testing a circuit

Test circuit

Address generator for generating addresses for testing a circuit

Method and device for reading and for checking the time position of...

Test data generator

Method of calibrating a test system for semiconductor components, a...

System for testing fast synchronous digital circuits, particularly...

Field-effect-controlled transistor and method for fabricating the t...

Address counter for addressing synchronous high-frequency digital c...

System for testing fast synchronous semiconductor circuits

System for testing fast integrated digital circuits, in particular...

Method and device for generating digital signal patterns

Circuit configuration for generating control signals for testing hi...