Michael Schmidt

Person

Gresham, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Depositive shielding for fiducial protection from redeposition
- Patent number 11,817,395
- Issue date Nov 14, 2023
- FEI Company
- Sean Morgan-Jones
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Fiducial design for tilted or glancing mill operations with a charg...
- Patent number 11,315,756
- Issue date Apr 26, 2022
- FEI Company
- Stacey Stone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diagonal compound mill
- Patent number 11,158,487
- Issue date Oct 26, 2021
- FEI Company
- Clifford Russell Bugge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated TEM sample preparation
- Patent number 10,825,651
- Issue date Nov 3, 2020
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Grant
Automated TEM sample preparation
- Patent number 10,340,119
- Issue date Jul 2, 2019
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Grant
High throughput TEM preparation processes and hardware for backside...
- Patent number 10,283,317
- Issue date May 7, 2019
- FEI Company
- Paul Keady
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Fiducial design for tilted or glancing mill operations with a charg...
- Patent number 10,026,590
- Issue date Jul 17, 2018
- FEI Company
- Stacey Stone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Glancing angle mill
- Patent number 9,941,096
- Issue date Apr 10, 2018
- FEI Company
- Michael Schmidt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High aspect ratio structure analysis
- Patent number 9,741,536
- Issue date Aug 22, 2017
- FEI Company
- Sang Hoon Lee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Surface delayering with a programmed manipulator
- Patent number 9,735,066
- Issue date Aug 15, 2017
- FEI Company
- Alexander Buxbaum
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Grant
Multidimensional structural access
- Patent number 9,696,372
- Issue date Jul 4, 2017
- FEI Company
- Jeffrey Blackwood
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High throughput TEM preparation processes and hardware for backside...
- Patent number 9,653,260
- Issue date May 16, 2017
- FEI Company
- Paul Keady
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Automated TEM sample preparation
- Patent number 9,601,313
- Issue date Mar 21, 2017
- FEI Company
- Valerie Brogden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for reducing curtaining in charged particle beam...
- Patent number 9,488,554
- Issue date Nov 8, 2016
- FEI Company
- Michael Schmidt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bulk deposition for tilted mill protection
- Patent number 9,412,560
- Issue date Aug 9, 2016
- FEI Company
- Stacey Stone
- G01 - MEASURING TESTING
Information Patent Grant
High capacity TEM grid
- Patent number 9,281,163
- Issue date Mar 8, 2016
- FEI Company
- Brian Roberts Routh
- G01 - MEASURING TESTING
Information Patent Grant
Method for preparing samples for imaging
- Patent number 8,822,921
- Issue date Sep 2, 2014
- FEI Company
- Michael Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Multiple sample attachment to nano manipulator for high throughput...
- Patent number 8,729,469
- Issue date May 20, 2014
- FEI Company
- Michael Schmidt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sputtering coating of protective layer for charged particle beam pr...
- Patent number 7,675,049
- Issue date Mar 9, 2010
- FEI Company
- Michael Schmidt
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and sample for radiation microscopy including a particle bea...
- Patent number 7,429,733
- Issue date Sep 30, 2008
- LSI Corporation
- Michael B. Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Failure analysis vehicle for yield enhancement with self test at sp...
- Patent number 7,420,229
- Issue date Sep 2, 2008
- LSI Corporation
- Richard Schultz
- G01 - MEASURING TESTING
Information Patent Grant
Failure analysis vehicle for yield enhancement with self test at sp...
- Patent number 7,129,101
- Issue date Oct 31, 2006
- LSI Logic Corporation
- Richard Schultz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEPOSITIVE SHIELDING FOR FIDUCIAL PROTECTION FROM REDEPOSITION
- Publication number 20220102284
- Publication date Mar 31, 2022
- FEI Company
- Sean Morgan-Jones
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIAGONAL COMPOUND MILL
- Publication number 20200312618
- Publication date Oct 1, 2020
- FEI Company
- Clifford Russell Bugge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED TEM SAMPLE PREPARATION
- Publication number 20190272975
- Publication date Sep 5, 2019
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Application
FIDUCIAL DESIGN FOR TILTED OR GLANCING MILL OPERATIONS WITH A CHARG...
- Publication number 20180301319
- Publication date Oct 18, 2018
- FEI Company
- Stacey Stone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GLANCING ANGLE MILL
- Publication number 20180247793
- Publication date Aug 30, 2018
- FEI Company
- Michael Schmidt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED TEM SAMPLE PREPARATION
- Publication number 20170256380
- Publication date Sep 7, 2017
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT TEM PREPARATION PROCESSES AND HARDWARE FOR BACKSIDE...
- Publication number 20170250055
- Publication date Aug 31, 2017
- FEI Company
- Paul Keady
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED TEM SAMPLE PREPARATION
- Publication number 20160141147
- Publication date May 19, 2016
- FEI Company
- Valerie Brogden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fiducial Design for Tilted or Glancing Mill Operations with a Charg...
- Publication number 20150357159
- Publication date Dec 10, 2015
- FEI Company
- Stacey Stone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PREPARING SAMPLES FOR IMAGING
- Publication number 20150330877
- Publication date Nov 19, 2015
- FEI Company
- Michael Schmidt
- G01 - MEASURING TESTING
Information Patent Application
High Capacity TEM Grid
- Publication number 20150294834
- Publication date Oct 15, 2015
- FEI Company
- Brian Roberts Routh
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Reducing Curtaining in Charged Particle Beam...
- Publication number 20150276567
- Publication date Oct 1, 2015
- FEI Company
- Michael Schmidt
- G01 - MEASURING TESTING
Information Patent Application
Multidimensional Structural Access
- Publication number 20150260784
- Publication date Sep 17, 2015
- FEI Company
- Jeffrey Blackwood
- G01 - MEASURING TESTING
Information Patent Application
High Aspect Ratio Structure Analysis
- Publication number 20150243478
- Publication date Aug 27, 2015
- FEI Company
- Sang Hoon Lee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Bulk Deposition for Tilted Mill Protection
- Publication number 20150243477
- Publication date Aug 27, 2015
- FEI Company
- Stacey Stone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface Delayering with a Programmed Manipulator
- Publication number 20150214124
- Publication date Jul 30, 2015
- FEI Company
- Alexander Buxbaum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PREPARING SAMPLES FOR IMAGING
- Publication number 20140190934
- Publication date Jul 10, 2014
- Michael Schmidt
- G01 - MEASURING TESTING
Information Patent Application
High Throughput TEM Preparation Processes and Hardware for Backside...
- Publication number 20130248354
- Publication date Sep 26, 2013
- Paul Keady
- G01 - MEASURING TESTING
Information Patent Application
Glancing Angle Mill
- Publication number 20130186747
- Publication date Jul 25, 2013
- FEI Company
- Michael Schmidt
- G01 - MEASURING TESTING
Information Patent Application
Sputtering coating of protective layer for charged particle beam pr...
- Publication number 20080073587
- Publication date Mar 27, 2008
- FEI Company
- Michael Schmidt
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and sample for radiation microscopy including a particle bea...
- Publication number 20070152151
- Publication date Jul 5, 2007
- Michael B. Schmidt
- G01 - MEASURING TESTING
Information Patent Application
Failure analysis vehicle for yield enhancement with self test at sp...
- Publication number 20070015297
- Publication date Jan 18, 2007
- LSI Logic Corporation
- Richard Schultz
- G05 - CONTROLLING REGULATING
Information Patent Application
Failure analysis vehicle for yield enhancement with self test at sp...
- Publication number 20050041454
- Publication date Feb 24, 2005
- Richard Schultz
- G05 - CONTROLLING REGULATING

Michael Schmidt

Person

Patents Grantslast 30 patents

Depositive shielding for fiducial protection from redeposition

Fiducial design for tilted or glancing mill operations with a charg...

Diagonal compound mill

Automated TEM sample preparation

Automated TEM sample preparation

High throughput TEM preparation processes and hardware for backside...

Fiducial design for tilted or glancing mill operations with a charg...

Glancing angle mill

High aspect ratio structure analysis

Surface delayering with a programmed manipulator

Multidimensional structural access

High throughput TEM preparation processes and hardware for backside...

Automated TEM sample preparation

Method and system for reducing curtaining in charged particle beam...

Bulk deposition for tilted mill protection

High capacity TEM grid

Method for preparing samples for imaging

Multiple sample attachment to nano manipulator for high throughput...

Sputtering coating of protective layer for charged particle beam pr...

Method and sample for radiation microscopy including a particle bea...

Failure analysis vehicle for yield enhancement with self test at sp...

Failure analysis vehicle for yield enhancement with self test at sp...

Patents Applicationslast 30 patents

DEPOSITIVE SHIELDING FOR FIDUCIAL PROTECTION FROM REDEPOSITION

DIAGONAL COMPOUND MILL

AUTOMATED TEM SAMPLE PREPARATION

FIDUCIAL DESIGN FOR TILTED OR GLANCING MILL OPERATIONS WITH A CHARG...

GLANCING ANGLE MILL

AUTOMATED TEM SAMPLE PREPARATION

HIGH THROUGHPUT TEM PREPARATION PROCESSES AND HARDWARE FOR BACKSIDE...

AUTOMATED TEM SAMPLE PREPARATION

Fiducial Design for Tilted or Glancing Mill Operations with a Charg...

METHOD FOR PREPARING SAMPLES FOR IMAGING

High Capacity TEM Grid

Method and System for Reducing Curtaining in Charged Particle Beam...

Multidimensional Structural Access

High Aspect Ratio Structure Analysis

Bulk Deposition for Tilted Mill Protection

Surface Delayering with a Programmed Manipulator

METHOD FOR PREPARING SAMPLES FOR IMAGING

High Throughput TEM Preparation Processes and Hardware for Backside...

Glancing Angle Mill

Sputtering coating of protective layer for charged particle beam pr...

Method and sample for radiation microscopy including a particle bea...

Failure analysis vehicle for yield enhancement with self test at sp...

Failure analysis vehicle for yield enhancement with self test at sp...