Michael Schnell

Person

Rechberghausen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and devices for examining an electrically charged specimen...
- Patent number 11,170,970
- Issue date Nov 9, 2021
- Carl Zeiss SMT GmbH
- Michael Budach
- G01 - MEASURING TESTING
Information Patent Grant
High-voltage supply unit and circuit arrangement for generating a h...
- Patent number 10,546,717
- Issue date Jan 28, 2020
- Carl Zeiss Microscopy GmbH
- Edgar Fichter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and devices for examining an electrically charged specimen...
- Patent number 10,068,747
- Issue date Sep 4, 2018
- Carl Zeiss SMT GmbH
- Michael Budach
- G01 - MEASURING TESTING
Information Patent Grant
High-voltage supply unit and circuit arrangement for generating a h...
- Patent number 9,953,804
- Issue date Apr 24, 2018
- Carl Zeiss Microscopy GmbH
- Edgar Fichter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam apparatus and method for operating a particle beam ap...
- Patent number 9,947,504
- Issue date Apr 17, 2018
- Carl Zeiss Microscopy GmbH
- Klaus Hegele
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam device comprising an electrode unit
- Patent number 9,312,093
- Issue date Apr 12, 2016
- Carl Zeiss Microscopy GmbH
- Joerg Fober
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam device and method for analyzing and/or treating an ob...
- Patent number 8,946,650
- Issue date Feb 3, 2015
- Carl Zeiss Microscopy GmbH
- Michael Schnell
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOG...
- Publication number 20240272099
- Publication date Aug 15, 2024
- Carl Zeiss SMT GMBH
- Daniel Schwarz
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR IMAGING AND PROCESSING A SAMPLE USING A FOCUSED PARTICLE...
- Publication number 20240062989
- Publication date Feb 22, 2024
- Carl Zeiss SMT GMBH
- Daniel Schwarz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND DEVICES FOR EXAMINING AN ELECTRICALLY CHARGED SPECIMEN...
- Publication number 20190035601
- Publication date Jan 31, 2019
- Carl Zeiss SMT GMBH
- Michael Budach
- G01 - MEASURING TESTING
Information Patent Application
HIGH-VOLTAGE SUPPLY UNIT AND CIRCUIT ARRANGEMENT FOR GENERATING A H...
- Publication number 20180211815
- Publication date Jul 26, 2018
- CARL ZEISS MICROSCOPY GMBH
- Edgar Fichter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM APPARATUS AND METHOD FOR OPERATING A PARTICLE BEAM AP...
- Publication number 20170236683
- Publication date Aug 17, 2017
- CARL ZEISS MICROSCOPY GMBH
- Klaus Hegele
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND DEVICES FOR EXAMINING AN ELECTRICALLY CHARGED SPECIMEN...
- Publication number 20170062180
- Publication date Mar 2, 2017
- Carl Zeiss SMT GMBH
- Michael Budach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-VOLTAGE SUPPLY UNIT AND CIRCUIT ARRANGEMENT FOR GENERATING A H...
- Publication number 20160314931
- Publication date Oct 27, 2016
- CARL ZEISS MICROSCOPY GMBH
- Edgar Fichter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM DEVICE AND METHOD FOR ANALYZING AND/OR TREATING AN OB...
- Publication number 20120080594
- Publication date Apr 5, 2012
- Michael SCHNELL
- H01 - BASIC ELECTRIC ELEMENTS

Michael Schnell

Person

Patents Grantslast 30 patents

Methods and devices for examining an electrically charged specimen...

High-voltage supply unit and circuit arrangement for generating a h...

Methods and devices for examining an electrically charged specimen...

High-voltage supply unit and circuit arrangement for generating a h...

Particle beam apparatus and method for operating a particle beam ap...

Particle beam device comprising an electrode unit

Particle beam device and method for analyzing and/or treating an ob...

Patents Applicationslast 30 patents

HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOG...

DEVICE FOR IMAGING AND PROCESSING A SAMPLE USING A FOCUSED PARTICLE...

METHODS AND DEVICES FOR EXAMINING AN ELECTRICALLY CHARGED SPECIMEN...

HIGH-VOLTAGE SUPPLY UNIT AND CIRCUIT ARRANGEMENT FOR GENERATING A H...

PARTICLE BEAM APPARATUS AND METHOD FOR OPERATING A PARTICLE BEAM AP...

METHODS AND DEVICES FOR EXAMINING AN ELECTRICALLY CHARGED SPECIMEN...

HIGH-VOLTAGE SUPPLY UNIT AND CIRCUIT ARRANGEMENT FOR GENERATING A H...

PARTICLE BEAM DEVICE AND METHOD FOR ANALYZING AND/OR TREATING AN OB...