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Michael Schoeneich
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Hamburg, DE
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Patents Grants
last 30 patents
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Patent Grant
Method for identifying a fault at a device output and system therefor
Patent number
10,782,347
Issue date
Sep 22, 2020
NXP B.V.
Robert Meyer
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
System and method for sensor diagnostics during functional operation
Patent number
10,677,620
Issue date
Jun 9, 2020
NXP B.V.
Robert Meyer
G01 - MEASURING TESTING
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Patent Grant
Sensor system with a three half-bridge configuration
Patent number
9,891,074
Issue date
Feb 13, 2018
NXP B.V.
Robert Meyer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR SENSOR DIAGNOSTICS DURING FUNCTIONAL OPERATION
Publication number
20190339101
Publication date
Nov 7, 2019
NXP B.V.
Robert Meyer
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IDENTIFYING A FAULT AT A DEVICE OUTPUT AND SYSTEM THEREFOR
Publication number
20190120903
Publication date
Apr 25, 2019
NXP B.V.
Robert Meyer
G01 - MEASURING TESTING
Information
Patent Application
SENSOR SYSTEM WITH A THREE HALF-BRIDGE CONFIGURATION
Publication number
20150377646
Publication date
Dec 31, 2015
NXP B.V.
Robert Meyer
G01 - MEASURING TESTING