Michael Schroeder

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East Hampton, CT, US

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Patents Grantslast 30 patents

Information Patent Grant
Interferometric heterodyne optical encoder system
- Patent number 9,140,537
- Issue date Sep 22, 2015
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric encoder systems
- Patent number 8,988,690
- Issue date Mar 24, 2015
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric heterodyne optical encoder system
- Patent number 8,885,172
- Issue date Nov 11, 2014
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric encoder systems
- Patent number 8,670,127
- Issue date Mar 11, 2014
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric encoder systems
- Patent number 8,300,233
- Issue date Oct 30, 2012
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Grant
Reduction of thermal non-cyclic error effects in interferometers
- Patent number 7,180,603
- Issue date Feb 20, 2007
- Zygo Corporation
- Henry A. Hill
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERFEROMETRIC HETERODYNE OPTICAL ENCODER SYSTEM
- Publication number 20150043005
- Publication date Feb 12, 2015
- Zygo Corporation
- Peter J. de Groot
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC ENCODER SYSTEMS
- Publication number 20140049782
- Publication date Feb 20, 2014
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC HETERODYNE OPTICAL ENCODER SYSTEM
- Publication number 20120194824
- Publication date Aug 2, 2012
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC ENCODER SYSTEMS
- Publication number 20120170048
- Publication date Jul 5, 2012
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC ENCODER SYSTEMS
- Publication number 20110255096
- Publication date Oct 20, 2011
- Zygo Corporation
- Leslie L. Deck
- G01 - MEASURING TESTING
Information Patent Application
Reduction of thermal non-cyclic error effects in interferometers
- Publication number 20050094155
- Publication date May 5, 2005
- Henry A. Hill
- G01 - MEASURING TESTING