Michael Schubert

Person

Bremen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Trapping ion mobility spectrometer with parallel accumulation
- Patent number 9,683,964
- Issue date Jun 20, 2017
- Melvin Andrew Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mixed radio frequency multipole rod system as ion reactor
- Patent number 8,314,384
- Issue date Nov 20, 2012
- Bruker Daltonik GmbH
- Carsten Stoermer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for operating three-dimensional RF ion traps with high ion c...
- Patent number 8,164,056
- Issue date Apr 24, 2012
- Bruker Daltonik GmbH
- Melvin A. Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional RF ion traps with high ion capture efficiency
- Patent number 7,872,229
- Issue date Jan 18, 2011
- Bruker Daltonik, GmbH
- Melvin A. Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Daughter ion spectra with time-of-flight mass spectrometers
- Patent number 7,301,145
- Issue date Nov 27, 2007
- Bruker Daltonik, GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for the capture of ions in quadrupole ion traps
- Patent number 6,989,534
- Issue date Jan 24, 2006
- Bruker Daltonik GmbH
- Michael Schubert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fragmentation in quadrupole ion trap mass spectrometers
- Patent number 6,410,913
- Issue date Jun 25, 2002
- Bruker Daltonik GmbH
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometer of high mass-constancy
- Patent number 6,133,568
- Issue date Oct 17, 2000
- Bruker Daltonik GmbH
- Gerhard Weiss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for space-charge control of daughter ions in ion traps
- Patent number 5,936,241
- Issue date Aug 10, 1999
- Bruker Daltonik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of comparative analysis using ion trap mass spectrometers
- Patent number 5,903,003
- Issue date May 11, 1999
- Bruker Daltonik GmbH
- Michael Schubert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Temporary storage of ions for mass spectrometric analyses
- Patent number 5,811,800
- Issue date Sep 22, 1998
- Bruker-Franzen Analytik GmbH
- Jochen Franzen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for controlling the ion generation rate for mass selective l...
- Patent number 5,710,427
- Issue date Jan 20, 1998
- Bruker-Franzen Analytik GmbH
- Michael Schubert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for exciting the oscillations of ions in ion traps with freq...
- Patent number 5,654,542
- Issue date Aug 5, 1997
- Bruker-Franzen Analytik GmbH
- Michael Schubert
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TRAPPING ION MOBILITY SPECTROMETER WITH PARALLEL ACCUMULATION
- Publication number 20160231275
- Publication date Aug 11, 2016
- Bruker Daltonik GmbH
- Melvin Andrew PARK
- G01 - MEASURING TESTING
Information Patent Application
MIXED RADIO FREQUENCY MULTIPOLE ROD SYSTEM AS ION REACTOR
- Publication number 20110284741
- Publication date Nov 24, 2011
- Carsten Stoermer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for operating three-dimensional RF ion traps with high ion c...
- Publication number 20110139976
- Publication date Jun 16, 2011
- Bruker Daltonik GmbH
- Melvin A. Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE-DIMENSIONAL RF ION TRAPS WITH HIGH ION CAPTURE EFFICIENCY
- Publication number 20090032700
- Publication date Feb 5, 2009
- Bruker Daltonik GmbH
- Melvin A. Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Daughter ion spectra with time-of-flight mass spectrometers
- Publication number 20060108521
- Publication date May 25, 2006
- Bruker Daltonik GmbH
- Armin Holle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and device for the capture of ions in quadrupole ion traps
- Publication number 20050023461
- Publication date Feb 3, 2005
- Bruker Daltonik GmbH
- Michael Schubert
- H01 - BASIC ELECTRIC ELEMENTS

Michael Schubert

Person

Patents Grantslast 30 patents

Trapping ion mobility spectrometer with parallel accumulation

Mixed radio frequency multipole rod system as ion reactor

Method for operating three-dimensional RF ion traps with high ion c...

Three-dimensional RF ion traps with high ion capture efficiency

Daughter ion spectra with time-of-flight mass spectrometers

Method and device for the capture of ions in quadrupole ion traps

Fragmentation in quadrupole ion trap mass spectrometers

Ion trap mass spectrometer of high mass-constancy

Method for space-charge control of daughter ions in ion traps

Methods of comparative analysis using ion trap mass spectrometers

Temporary storage of ions for mass spectrometric analyses

Method for controlling the ion generation rate for mass selective l...

Method for exciting the oscillations of ions in ion traps with freq...

Patents Applicationslast 30 patents

TRAPPING ION MOBILITY SPECTROMETER WITH PARALLEL ACCUMULATION

MIXED RADIO FREQUENCY MULTIPOLE ROD SYSTEM AS ION REACTOR

Method for operating three-dimensional RF ion traps with high ion c...

THREE-DIMENSIONAL RF ION TRAPS WITH HIGH ION CAPTURE EFFICIENCY

Daughter ion spectra with time-of-flight mass spectrometers

Method and device for the capture of ions in quadrupole ion traps