Michael Servedio

Person

Boca Raton, FL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic probe replacement in a scanning probe microscope
- Patent number 6,093,930
- Issue date Jul 25, 2000
- International Business Machnines Corporation
- James Edward Boyette
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Miniature probe positioning actuator
- Patent number 5,804,982
- Issue date Sep 8, 1998
- International Business Machines Corporation
- Jiann-Chang Lo
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for wirebonding using a tubular piezoelectric ultrasonic...
- Patent number 5,775,567
- Issue date Jul 7, 1998
- International Business Machines Corporation
- Jiann-Chang Lo
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and system for controlling high-speed probe actuators
- Patent number 5,635,848
- Issue date Jun 3, 1997
- International Business Machines Corporation
- James M. Hammond
- G01 - MEASURING TESTING
Information Patent Grant
Miniature probe positioning actuator
- Patent number 5,635,849
- Issue date Jun 3, 1997
- International Business Machines Corporation
- Jiann-Chang Lo
- G01 - MEASURING TESTING
Information Patent Grant
Linkage drive mechanism for ultrasonic wirebonding
- Patent number 5,626,276
- Issue date May 6, 1997
- International Business Machines Corporation
- Jiann-Chang Lo
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
High speed test probe positioning system
- Patent number 5,550,483
- Issue date Aug 27, 1996
- International Business Machines
- James E. Boyette
- G01 - MEASURING TESTING
Information Patent Grant
Open frame gantry probing system
- Patent number 5,543,726
- Issue date Aug 6, 1996
- International Business Machines Corporation
- James E. Boyette
- G01 - MEASURING TESTING
Information Patent Grant
Miniature probe positioning actuator
- Patent number 5,532,611
- Issue date Jul 2, 1996
- International Business Machines Corporation
- Jiann-Chang Lo
- G01 - MEASURING TESTING
Information Patent Grant
Split-fixture configuration and method for testing circuit traces o...
- Patent number 5,461,324
- Issue date Oct 24, 1995
- International Business Machines Corporation
- James E. Boyette
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for opens and shorts testing of a circuit board
- Patent number 5,432,460
- Issue date Jul 11, 1995
- International Business Machines Corporation
- Edwin Flecha
- G01 - MEASURING TESTING

Michael Servedio

Person

Patents Grantslast 30 patents

Automatic probe replacement in a scanning probe microscope

Miniature probe positioning actuator

Apparatus for wirebonding using a tubular piezoelectric ultrasonic...

Method and system for controlling high-speed probe actuators

Miniature probe positioning actuator

Linkage drive mechanism for ultrasonic wirebonding

High speed test probe positioning system

Open frame gantry probing system

Miniature probe positioning actuator

Split-fixture configuration and method for testing circuit traces o...

Apparatus and method for opens and shorts testing of a circuit board