Michael Shifrin

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Ashqelon, IL

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device manufacture with in-line hotspot detection
- Patent number 12,057,355
- Issue date Aug 6, 2024
- Nova Ltd.
- Michael Shifrin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology method and system
- Patent number 11,450,541
- Issue date Sep 20, 2022
- Nova Ltd.
- Vladimir Machavariani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TEM-based metrology method and system
- Patent number 11,309,162
- Issue date Apr 19, 2022
- Nova Ltd.
- Vladimir Machavariani
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY METHOD AND SYSTEM
- Publication number 20230074398
- Publication date Mar 9, 2023
- NOVA LTD
- VLADIMIR MACHAVARIANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEM-BASED METROLOGY METHOD AND SYSTEM
- Publication number 20220310356
- Publication date Sep 29, 2022
- NOVA LTD
- VLADIMIR MACHAVARIANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURE WITH IN-LINE HOTSPOT DETECTION
- Publication number 20220208620
- Publication date Jun 30, 2022
- NOVA LTD
- MICHAEL SHIFRIN
- G06 - COMPUTING CALCULATING COUNTING