Michael Shifrin

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Ashqelon, IL

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Patents Grantslast 30 patents

Information Patent Grant
TEM-based metrology method and system
- Patent number 10,916,404
- Issue date Feb 9, 2021
- Nova Measuring Instruments Ltd.
- Vladimir Machavariani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lithographic patterning for sub-90nm with a multi-layered carbon-ba...
- Patent number 7,803,715
- Issue date Sep 28, 2010
- Shai Haimson
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TEM-BASED METROLOGY METHOD AND SYSTEM
- Publication number 20210217581
- Publication date Jul 15, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- VLADIMIR MACHAVARIANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY METHOD AND SYSTEM
- Publication number 20200294829
- Publication date Sep 17, 2020
- NOVA MEASURING INSTRUMENTS LTD.
- VLADIMIR MACHAVARIANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEM-BASED METROLOGY METHOD AND SYSTEM
- Publication number 20190393016
- Publication date Dec 26, 2019
- NOVA MEASURING INSTRUMENTS LTD.
- VLADIMIR MACHAVARIANI
- G06 - COMPUTING CALCULATING COUNTING