Michael Simmons

Person

Colton, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe systems including imaging devices with objective lens isolato...
- Patent number 11,874,301
- Issue date Jan 16, 2024
- FormFactor, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Grant
Probe systems for optically probing a device under test and methods...
- Patent number 11,131,709
- Issue date Sep 28, 2021
- FormFactor, Inc.
- Joseph George Frankel
- G01 - MEASURING TESTING
Information Patent Grant
Calibration chucks for optical probe systems, optical probe systems...
- Patent number 11,047,795
- Issue date Jun 29, 2021
- FormFactor, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Grant
Probe systems for testing a device under test
- Patent number 10,698,002
- Issue date Jun 30, 2020
- FormFactor Beaverton, Inc.
- Christopher Storm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shielded probe systems
- Patent number 10,060,950
- Issue date Aug 28, 2018
- FormFactor Beaverton, Inc.
- Michael E Simmons
- G01 - MEASURING TESTING
Information Patent Grant
High voltage chuck for a probe station
- Patent number 10,062,597
- Issue date Aug 28, 2018
- FormFactor Beaverton, Inc.
- Michael E. Simmons
- G01 - MEASURING TESTING
Information Patent Grant
Wafer-handling end effectors with wafer-contacting surfaces and sea...
- Patent number 9,991,152
- Issue date Jun 5, 2018
- Cascade Microtech, Inc.
- Robbie Ingram-Goble
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
High voltage chuck for a probe station
- Patent number 9,741,599
- Issue date Aug 22, 2017
- Cascade Microtech, Inc.
- Michael E. Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High voltage chuck for a probe station
- Patent number 9,506,973
- Issue date Nov 29, 2016
- Cascade Microtech, Inc.
- Michael E. Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low noise connector with cables having a center, middle and outer c...
- Patent number 8,167,648
- Issue date May 1, 2012
- Cascade Microtech, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Grant
Probe station with low noise characteristics
- Patent number 7,550,984
- Issue date Jun 23, 2009
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Grant
Probe station with low noise characteristics
- Patent number 7,295,025
- Issue date Nov 13, 2007
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Grant
Probe station with low noise characteristics
- Patent number 7,138,810
- Issue date Nov 21, 2006
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Grant
Probe station with low noise characteristics
- Patent number 6,847,219
- Issue date Jan 25, 2005
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE SYSTEMS INCLUDING IMAGING DEVICES WITH OBJECTIVE LENS ISOLATO...
- Publication number 20210132115
- Publication date May 6, 2021
- FormFactor Beaverton, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS FOR OPTICALLY PROBING A DEVICE UNDER TEST AND METHODS...
- Publication number 20210096176
- Publication date Apr 1, 2021
- FormFactor Beaverton, Inc.
- Joseph George Frankel
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION CHUCKS FOR OPTICAL PROBE SYSTEMS, OPTICAL PROBE SYSTEMS...
- Publication number 20200378888
- Publication date Dec 3, 2020
- FormFactor Beaverton, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS FOR TESTING A DEVICE UNDER TEST
- Publication number 20190101567
- Publication date Apr 4, 2019
- FormFactor Beaverton, Inc.
- Christopher Storm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH VOLTAGE CHUCK FOR A PROBE STATION
- Publication number 20170338142
- Publication date Nov 23, 2017
- Cascade Microtech, Inc.
- Michael E. Simmons
- G01 - MEASURING TESTING
Information Patent Application
SHIELDED PROBE SYSTEMS
- Publication number 20170205446
- Publication date Jul 20, 2017
- Michael E. Simmons
- G01 - MEASURING TESTING
Information Patent Application
HIGH VOLTAGE CHUCK FOR A PROBE STATION
- Publication number 20160195579
- Publication date Jul 7, 2016
- Cascade Microtech, Inc.
- Michael E. Simmons
- G01 - MEASURING TESTING
Information Patent Application
WAFER-HANDLING END EFFECTORS
- Publication number 20150255322
- Publication date Sep 10, 2015
- Cascade Microtech, Inc.
- Robbie Ingram-Goble
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
HIGH VOLTAGE CHUCK FOR A PROBE STATION
- Publication number 20130075982
- Publication date Mar 28, 2013
- Cascade Microtech, Inc.
- Michael E. Simmons
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION WITH IMPROVED INTERCONNECTION
- Publication number 20110207370
- Publication date Aug 25, 2011
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Application
Probe station with low noise characteristics
- Publication number 20080054922
- Publication date Mar 6, 2008
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Application
Probe station with low noise characteristics
- Publication number 20070018665
- Publication date Jan 25, 2007
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Application
Probe station with low noise characteristics
- Publication number 20050104610
- Publication date May 19, 2005
- Timothy Lesher
- G01 - MEASURING TESTING

Michael Simmons

Person

Patents Grantslast 30 patents

Probe systems including imaging devices with objective lens isolato...

Probe systems for optically probing a device under test and methods...

Calibration chucks for optical probe systems, optical probe systems...

Probe systems for testing a device under test

Shielded probe systems

High voltage chuck for a probe station

Wafer-handling end effectors with wafer-contacting surfaces and sea...

High voltage chuck for a probe station

High voltage chuck for a probe station

Low noise connector with cables having a center, middle and outer c...

Probe station with low noise characteristics

Probe station with low noise characteristics

Probe station with low noise characteristics

Probe station with low noise characteristics

Patents Applicationslast 30 patents

PROBE SYSTEMS INCLUDING IMAGING DEVICES WITH OBJECTIVE LENS ISOLATO...

PROBE SYSTEMS FOR OPTICALLY PROBING A DEVICE UNDER TEST AND METHODS...

CALIBRATION CHUCKS FOR OPTICAL PROBE SYSTEMS, OPTICAL PROBE SYSTEMS...

PROBE SYSTEMS FOR TESTING A DEVICE UNDER TEST

HIGH VOLTAGE CHUCK FOR A PROBE STATION

SHIELDED PROBE SYSTEMS

HIGH VOLTAGE CHUCK FOR A PROBE STATION

WAFER-HANDLING END EFFECTORS

HIGH VOLTAGE CHUCK FOR A PROBE STATION

PROBE STATION WITH IMPROVED INTERCONNECTION

Probe station with low noise characteristics

Probe station with low noise characteristics

Probe station with low noise characteristics