Michael Stelzl

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Mainz, DE

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for identifying defects within the volume of a...
- Patent number 9,546,967
- Issue date Jan 17, 2017
- Schott AG
- Bruno Schrader
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for detecting cracks in semiconductor substrates
- Patent number 9,157,869
- Issue date Oct 13, 2015
- Schott AG
- Andreas Ortner
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for generating digital still pictures of wafer-sh...
- Patent number 8,233,697
- Issue date Jul 31, 2012
- Schott AG
- Michael Stelzl
- G01 - MEASURING TESTING
Information Patent Grant
Standard for referencing luminescence signals
- Patent number 7,521,670
- Issue date Apr 21, 2009
- Schott AG
- Axel Engel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR IDENTIFYING DEFECTS WITHIN THE VOLUME OF A...
- Publication number 20140347664
- Publication date Nov 27, 2014
- Bruno Schrader
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETECTING CRACKS IN SEMICONDUCTOR SUBSTRATES
- Publication number 20120307236
- Publication date Dec 6, 2012
- SCHOTT AG
- Andreas Ortner
- G01 - MEASURING TESTING
Information Patent Application
Method and device for generating digital still pictures of wafer-sh...
- Publication number 20100061621
- Publication date Mar 11, 2010
- Michael Stelzl
- G01 - MEASURING TESTING
Information Patent Application
Method for Measuring Topographic Structures on Devices
- Publication number 20080144006
- Publication date Jun 19, 2008
- SCHOTT AG
- Michael Stelzl
- G02 - OPTICS
Information Patent Application
Standard for referencing luminescence signals
- Publication number 20060202118
- Publication date Sep 14, 2006
- Axel Engel
- G01 - MEASURING TESTING
Information Patent Application
Standard for referencing luminescence signals
- Publication number 20060199018
- Publication date Sep 7, 2006
- Axel Engel
- G01 - MEASURING TESTING