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Michael Sweeney
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Hemel Hemsptead, GB
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Patents Grants
last 30 patents
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Patent Grant
Monitoring apparatus and method for improving the accuracy and repe...
Patent number
7,713,404
Issue date
May 11, 2010
Nanometrics Incorporated
Ian Mayes
G01 - MEASURING TESTING
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Patent Grant
Micro defects in semi-conductors
Patent number
7,446,868
Issue date
Nov 4, 2008
Nanometrics Incorporated
Victor Higgs
G01 - MEASURING TESTING
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Patent Grant
Micro defects in semi-conductors
Patent number
7,113,276
Issue date
Sep 26, 2006
ASTI Operating Company, Inc.
Victor Higgs
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Monitoring apparatus and method for improving the accuracy and repe...
Publication number
20060207887
Publication date
Sep 21, 2006
Ian Mayes
G01 - MEASURING TESTING