Michael Sweeney

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Hemel Hemsptead, GB

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Patents Grantslast 30 patents

Information Patent Grant
Monitoring apparatus and method for improving the accuracy and repe...
- Patent number 7,713,404
- Issue date May 11, 2010
- Nanometrics Incorporated
- Ian Mayes
- G01 - MEASURING TESTING
Information Patent Grant
Micro defects in semi-conductors
- Patent number 7,446,868
- Issue date Nov 4, 2008
- Nanometrics Incorporated
- Victor Higgs
- G01 - MEASURING TESTING
Information Patent Grant
Micro defects in semi-conductors
- Patent number 7,113,276
- Issue date Sep 26, 2006
- ASTI Operating Company, Inc.
- Victor Higgs
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Monitoring apparatus and method for improving the accuracy and repe...
- Publication number 20060207887
- Publication date Sep 21, 2006
- Ian Mayes
- G01 - MEASURING TESTING