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Michael T. James
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Dayton, OH, US
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Patents Grants
last 30 patents
Information
Patent Grant
Replaceable probe head
Patent number
9,200,929
Issue date
Dec 1, 2015
YSI Incorporated
Christopher J. Palassis
G01 - MEASURING TESTING
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Patent Grant
Replaceable probe head
Patent number
8,664,938
Issue date
Mar 4, 2014
YSI Incorporated
Christopher J. Palassis
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
REPLACEABLE PROBE HEAD
Publication number
20140130621
Publication date
May 15, 2014
YSI INCORPORATED
Christopher J. Palassis
G01 - MEASURING TESTING
Information
Patent Application
REPLACEABLE PROBE HEAD
Publication number
20110273165
Publication date
Nov 10, 2011
YSI INCORPORATED
Christopher J. Palassis
G01 - MEASURING TESTING
Information
Patent Application
WIPEABLE CONDUCTIVITY PROBE AND METHOD OF MAKING SAME
Publication number
20100321046
Publication date
Dec 23, 2010
YSI INCORPORATED
Robert C. Randall
G01 - MEASURING TESTING