Michael Tanguay

Person

  • Portland, OR, US

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    Method and Apparatus for Sample Extraction and Handling

    • Publication number 20150311034
    • Publication date Oct 29, 2015
    • FEI Company
    • Enrique Agorio
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING

    • Publication number 20130153785
    • Publication date Jun 20, 2013
    • FEI Company
    • Enrique Agorio
    • G01 - MEASURING TESTING
  • Information Patent Application

    Dual Beam System

    • Publication number 20110309263
    • Publication date Dec 22, 2011
    • FEI Company
    • Raymond Hill
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING

    • Publication number 20100305747
    • Publication date Dec 2, 2010
    • FEI Company
    • Enrique Agorio
    • G01 - MEASURING TESTING
  • Information Patent Application

    Dual Beam System

    • Publication number 20100025578
    • Publication date Feb 4, 2010
    • FEI Company
    • Raymond Hill
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Dual beam system

    • Publication number 20080035860
    • Publication date Feb 14, 2008
    • FEI Company
    • Raymond Hill
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Sample Preparation

    • Publication number 20070272854
    • Publication date Nov 29, 2007
    • Enrique Agorio
    • G02 - OPTICS
  • Information Patent Application

    Dual beam system

    • Publication number 20050035291
    • Publication date Feb 17, 2005
    • Raymond Hill
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    APPARATUS FOR TILTING A BEAM SYSTEM

    • Publication number 20030222221
    • Publication date Dec 4, 2003
    • Alexander Groholskiy
    • H01 - BASIC ELECTRIC ELEMENTS