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Michael Tanguay
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Portland, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for sample extraction and handling
Patent number
9,349,570
Issue date
May 24, 2016
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for sample extraction and handling
Patent number
8,993,962
Issue date
Mar 31, 2015
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Grant
Dual beam system
Patent number
8,399,864
Issue date
Mar 19, 2013
FEI Company
Raymond Hill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for sample extraction and handling
Patent number
8,357,913
Issue date
Jan 22, 2013
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Grant
Dual beam system
Patent number
8,013,311
Issue date
Sep 6, 2011
FEI Company
Raymond Hill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dual beam system
Patent number
7,601,976
Issue date
Oct 13, 2009
FEI Company
Raymond Hill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sample preparation
Patent number
7,511,282
Issue date
Mar 31, 2009
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Grant
Dual beam system
Patent number
7,161,159
Issue date
Jan 9, 2007
FEI Company
Raymond Hill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for tilting a beam system
Patent number
6,661,009
Issue date
Dec 9, 2003
FEI Company
Alexander Groholski
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Method and Apparatus for Sample Extraction and Handling
Publication number
20150311034
Publication date
Oct 29, 2015
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING
Publication number
20130153785
Publication date
Jun 20, 2013
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Application
Dual Beam System
Publication number
20110309263
Publication date
Dec 22, 2011
FEI Company
Raymond Hill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING
Publication number
20100305747
Publication date
Dec 2, 2010
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Application
Dual Beam System
Publication number
20100025578
Publication date
Feb 4, 2010
FEI Company
Raymond Hill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Dual beam system
Publication number
20080035860
Publication date
Feb 14, 2008
FEI Company
Raymond Hill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Sample Preparation
Publication number
20070272854
Publication date
Nov 29, 2007
Enrique Agorio
G02 - OPTICS
Information
Patent Application
Dual beam system
Publication number
20050035291
Publication date
Feb 17, 2005
Raymond Hill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS FOR TILTING A BEAM SYSTEM
Publication number
20030222221
Publication date
Dec 4, 2003
Alexander Groholskiy
H01 - BASIC ELECTRIC ELEMENTS