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Michael Teich
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Friedewald, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Probe systems and methods that utilize a flow-regulating structure...
Patent number
10,698,025
Issue date
Jun 30, 2020
FormFactor Beaverton, Inc.
Michael Teich
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Shielded probe systems with controlled testing environments
Patent number
10,281,492
Issue date
May 7, 2019
FormFactor Beaverton, Inc.
Michael Teich
G01 - MEASURING TESTING
Information
Patent Grant
Shielded probe systems with controlled testing environments
Patent number
9,784,763
Issue date
Oct 10, 2017
Cascade Microtech, Inc.
Michael Teich
G01 - MEASURING TESTING
Information
Patent Grant
Method for verifying a test substrate in a prober under defined the...
Patent number
9,632,108
Issue date
Apr 25, 2017
HSBC Bank USA, National Association
Michael Teich
G01 - MEASURING TESTING
Information
Patent Grant
Method for testing a test substrate under defined thermal condition...
Patent number
9,395,411
Issue date
Jul 19, 2016
Cascade Microtech, Inc.
Joerg Kiesewetter
G01 - MEASURING TESTING
Information
Patent Grant
Removing material from defective opening in glass mold
Patent number
9,254,533
Issue date
Feb 9, 2016
GLOBALFOUNDRIES, INC.
Jerome D. Cohen
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Removing material from defective opening in glass mold and related...
Patent number
8,800,952
Issue date
Aug 12, 2014
International Business Machines Corporation
Jerome D. Cohen
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method for verifying a test substrate in a prober under defined the...
Patent number
8,692,567
Issue date
Apr 8, 2014
Michael Teich
G01 - MEASURING TESTING
Information
Patent Grant
Method for testing a test substrate under defined thermal condition...
Patent number
8,497,693
Issue date
Jul 30, 2013
Cascade Microtech, Inc.
Joerg Kiesewetter
G01 - MEASURING TESTING
Information
Patent Grant
Probe station for on-wafer-measurement under EMI-shielding
Patent number
8,344,744
Issue date
Jan 1, 2013
Cascade Microtech, Inc.
Axel Schmidt
G01 - MEASURING TESTING
Information
Patent Grant
Chuck with triaxial construction
Patent number
8,240,650
Issue date
Aug 14, 2012
Cascade Microtech, Inc.
Michael Teich
G01 - MEASURING TESTING
Information
Patent Grant
Removing material from defective opening in glass mold
Patent number
8,237,086
Issue date
Aug 7, 2012
International Business Machines Corporation
Jerome D. Cohen
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method for increasing the accuracy of the positioning of a first ob...
Patent number
8,094,925
Issue date
Jan 10, 2012
Cascade Microtech, Inc.
Stefan Schneidewind
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Arrangement and method for focusing a multiplane image acquisition...
Patent number
8,072,586
Issue date
Dec 6, 2011
Cascade Microtech, Inc.
Michael Teich
G02 - OPTICS
Information
Patent Grant
Method and apparatus for the correction of defective solder bump ar...
Patent number
8,044,320
Issue date
Oct 25, 2011
Enrico Herz
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Device for rapidly changing objectives with the aid of threaded fas...
Patent number
7,796,352
Issue date
Sep 14, 2010
Cascade Microtech Dresden GmbH
Michael Teich
G02 - OPTICS
Information
Patent Grant
Test apparatus with loading device
Patent number
7,038,441
Issue date
May 2, 2006
SUSS MicroTec Testsystems GmbH
Karsten Stoll
G01 - MEASURING TESTING
Information
Patent Grant
Substrate-holding device for testing circuit arrangements on substr...
Patent number
6,864,676
Issue date
Mar 8, 2005
SUSS MicroTec Testsystems (GmbH)
Jorg Kiesewetter
G01 - MEASURING TESTING
Information
Patent Grant
Tester for pressure sensors
Patent number
6,688,156
Issue date
Feb 10, 2004
Karl Suss Dresden GmbH
Claus Dietrich
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PROBE SYSTEMS AND METHODS FOR COLLECTING AN OPTICAL IMAGE OF A DEVI...
Publication number
20200025823
Publication date
Jan 23, 2020
FormFactor Beaverton, Inc.
Michael Teich
G01 - MEASURING TESTING
Information
Patent Application
SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS
Publication number
20180031608
Publication date
Feb 1, 2018
Cascade Microtech, Inc.
Michael Teich
G01 - MEASURING TESTING
Information
Patent Application
SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS
Publication number
20170292974
Publication date
Oct 12, 2017
Cascade Microtech, Inc.
Michael Teich
G01 - MEASURING TESTING
Information
Patent Application
PROBE SYSTEMS AND METHODS INCLUDING ACTIVE ENVIRONMENTAL CONTROL
Publication number
20170248973
Publication date
Aug 31, 2017
Cascade Microtech, Inc.
Michael Teich
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THE...
Publication number
20140239991
Publication date
Aug 28, 2014
Cascade Microtech, Inc.
Michael Teich
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...
Publication number
20140028337
Publication date
Jan 30, 2014
Cascade Microtech, Inc.
Joerg Kiesewetter
G01 - MEASURING TESTING
Information
Patent Application
REMOVING MATERIAL FROM DEFECTIVE OPENING IN GLASS MOLD
Publication number
20120241116
Publication date
Sep 27, 2012
SUSS MICROTEC
Jerome D. Cohen
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
REMOVING MATERIAL FROM DEFECTIVE OPENING IN GLASS MOLD AND RELATED...
Publication number
20120186771
Publication date
Jul 26, 2012
SUSS Micro Tec
Jerome D. Cohen
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THE...
Publication number
20110241711
Publication date
Oct 6, 2011
Michael Teich
G01 - MEASURING TESTING
Information
Patent Application
PROBE STATION FOR ON-WAFER-MEASUREMENT UNDER EMI-SHIELDING
Publication number
20110227602
Publication date
Sep 22, 2011
CASCADE MICROTECH DRESDEN GMBH
Axel SCHMIDT
G01 - MEASURING TESTING
Information
Patent Application
ARRANGEMENT AND METHOD FOR IMAGE ACQUISITION ON A PROBER
Publication number
20110181710
Publication date
Jul 28, 2011
SUSS MicroTech Test Systems GmbH
Michael Teich
G02 - OPTICS
Information
Patent Application
ARRANGEMENT AND METHOD FOR FOCUSING A MULTIPLANE IMAGE ACQUISITION...
Publication number
20110013011
Publication date
Jan 20, 2011
SUSS MicroTec Test Systems GmbH
Michael Teich
G02 - OPTICS
Information
Patent Application
METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITION...
Publication number
20100289511
Publication date
Nov 18, 2010
SUSS MicroTec Test Systems GmbH
Joerg Kiesewetter
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR INCREASING THE ACCURACY OF THE POSITIONING OF A FIRST OB...
Publication number
20100111403
Publication date
May 6, 2010
Stefan Schineidewind
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PROBE FOR TEMPORARILY ELECTRICALLY CONTACTING A SOLAR CELL
Publication number
20100045264
Publication date
Feb 25, 2010
SUSS MicroTec Test Systems GmbH
Jorg KIESEWETTER
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR FORMING A TEMPORARY ELECTRICAL CONTACT TO A...
Publication number
20100045265
Publication date
Feb 25, 2010
SUSS MicroTec Test Systems GmbH
Jorg KIESEWETTER
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
REMOVING MATERIAL FROM DEFECTIVE OPENING IN GLASS MOLD AND RELATED...
Publication number
20090179020
Publication date
Jul 16, 2009
International Business Machines Corporation
Jerome D. Cohen
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Method For Increasing The Accuracy Of The Positioning Of A First Ob...
Publication number
20080298671
Publication date
Dec 4, 2008
SUSS MicroTec Testsystems (GmbH)
Stefan Schneidewind
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CHUCK WITH TRIAXIAL CONSTRUCTION
Publication number
20080224426
Publication date
Sep 18, 2008
SUSS MicroTec Test Systems GmbH
Michael TEICH
G01 - MEASURING TESTING
Information
Patent Application
ARRANGEMENT AND METHOD FOR FOCUSING A MULTIPLANE IMAGE ACQUISITION...
Publication number
20080212078
Publication date
Sep 4, 2008
SUSS Micro Tec Test Systems GmbH
Michael Teich
G02 - OPTICS
Information
Patent Application
DEVICE FOR RAPIDLY CHANGING OBJECTIVES WITH THE AID OF THREADED FAS...
Publication number
20080186602
Publication date
Aug 7, 2008
SUSS MicroTec Test Systems GmbH
Michael Teich
G02 - OPTICS
Information
Patent Application
METHOD AND APPARATUS FOR THE CORRECTION OF DEFECTIVE SOLDER BUMP AR...
Publication number
20080173697
Publication date
Jul 24, 2008
SUSS MicroTec Test Systems GmbH
Enrico Herz
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
ARRANGEMENT AND METHOD FOR IMAGE ACQUISITION ON A PROBER
Publication number
20080158664
Publication date
Jul 3, 2008
SUSS MicroTec Test Systems GmbH
Michael Teich
G02 - OPTICS
Information
Patent Application
PROCESS FOR THE INSPECTION OF A VARIETY OF REPETITIVE STRUCTURES
Publication number
20070064992
Publication date
Mar 22, 2007
SUSS MicroTec Test Systems GmbH
Michael Teich
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for increasing the accuracy of the positioning of a first ob...
Publication number
20040208355
Publication date
Oct 21, 2004
Stefan Schneidewind
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Test apparatus with loading device
Publication number
20040108847
Publication date
Jun 10, 2004
Karsten Stoll
G01 - MEASURING TESTING
Information
Patent Application
Substrate-holding device for testing circuit arrangements on substr...
Publication number
20020163350
Publication date
Nov 7, 2002
Jorg Kiesewetter
G01 - MEASURING TESTING
Information
Patent Application
Tester for pressure sensors
Publication number
20020152794
Publication date
Oct 24, 2002
Claus Dietrich
G01 - MEASURING TESTING