Michael Tenney

Person

Hopewell Junction, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
High frequency capacitance-voltage nanoprobing characterization
- Patent number 9,170,273
- Issue date Oct 27, 2015
- GlobalFoundries U.S. 2 LLC
- Terence L. Kane
- G01 - MEASURING TESTING
Information Patent Grant
Inert gas delivery system for electrical inspection apparatus
- Patent number 9,052,338
- Issue date Jun 9, 2015
- International Business Machines Corporation
- Terence Lawrence Kane
- G01 - MEASURING TESTING
Information Patent Grant
Inert gas delivery system for electrical inspection apparatus
- Patent number 8,701,511
- Issue date Apr 22, 2014
- International Business Machines Corporation
- Richard Walter Oldrey
- G01 - MEASURING TESTING
Information Patent Grant
Antifuse structure for in line circuit modification
- Patent number 8,367,483
- Issue date Feb 5, 2013
- International Business Machines Corporation
- Terence L. Kane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Antifuse structure for in line circuit modification
- Patent number 8,368,070
- Issue date Feb 5, 2013
- International Business Machines Corporation
- Terence L. Kane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Antifuse structure for in line circuit modification
- Patent number 8,368,069
- Issue date Feb 5, 2013
- International Business Machines Corporation
- Terence L. Kane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Antifuse structure for in line circuit modification
- Patent number 8,367,484
- Issue date Feb 5, 2013
- International Business Machines Corporation
- Terence L. Kane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Antifuse structure for in line circuit modification
- Patent number 8,125,048
- Issue date Feb 28, 2012
- International Business Machines Corporation
- Terence L. Kane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Backside unlayering of MOSFET devices for electrical and physical c...
- Patent number 7,993,504
- Issue date Aug 9, 2011
- International Business Machines Corporation
- Terence L Kane
- G01 - MEASURING TESTING
Information Patent Grant
Programmable precision resistor and method of programming the same
- Patent number 7,881,093
- Issue date Feb 1, 2011
- International Business Machines Corporation
- Anthony G. Domenicucci
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Backside unlayering of MOSFET devices for electrical and physical c...
- Patent number 7,371,689
- Issue date May 13, 2008
- International Business Machines Corporation
- Terence L Kane
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for selected site backside unlayering of si, G...
- Patent number 7,205,237
- Issue date Apr 17, 2007
- International Business Machines Corporation
- Andrew Deering
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of processing backside unlayering of MOSFET devices for elec...
- Patent number 7,015,146
- Issue date Mar 21, 2006
- International Business Machines Corporation
- Terence L. Kane
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for fabricating electrical connections to semic...
- Patent number 6,888,224
- Issue date May 3, 2005
- International Business Machines Corporation
- Terence Lawrence Kane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Site-specific methodology for localization and analyzing junction d...
- Patent number 6,884,641
- Issue date Apr 26, 2005
- International Business Machines Corporation
- John Bruley
- G01 - MEASURING TESTING
Information Patent Grant
Method for electrically characterizing charge sensitive semiconduct...
- Patent number 6,858,530
- Issue date Feb 22, 2005
- International Business Machines Corporation
- Terence Kane
- G01 - MEASURING TESTING
Information Patent Grant
Structure for detecting charging effects in device processing
- Patent number 6,703,641
- Issue date Mar 9, 2004
- International Business Machines Corporation
- Terence L. Kane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure and method for charge sensitive electrical devices
- Patent number 6,670,717
- Issue date Dec 30, 2003
- International Business Machines Corporation
- Terence Kane
- G01 - MEASURING TESTING
Information Patent Grant
Methods for fabricating electrical connections to semiconductor str...
- Patent number 6,630,395
- Issue date Oct 7, 2003
- International Business Machines Corporation
- Terence Lawrence Kane
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HIGH FREQUENCY CAPACITANCE-VOLTAGE NANOPROBING CHARACTERIZATION
- Publication number 20150160261
- Publication date Jun 11, 2015
- International Business Machines Corporation
- Terence L. Kane
- G01 - MEASURING TESTING
Information Patent Application
INERT GAS DELIVERY SYSTEM FOR ELECTRICAL INSPECTION APPARATUS
- Publication number 20140069165
- Publication date Mar 13, 2014
- Terence Lawrence Kane
- G02 - OPTICS
Information Patent Application
INERT GAS DELIVERY SYSTEM FOR ELECTRICAL INSPECTION APPARATUS
- Publication number 20120240657
- Publication date Sep 27, 2012
- International Business Machines Corporation
- Richard Walter Oldrey
- G02 - OPTICS
Information Patent Application
ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION
- Publication number 20120126366
- Publication date May 24, 2012
- International Business Machines Corporation
- Terence L. Kane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION
- Publication number 20120129340
- Publication date May 24, 2012
- International Business Machines Corporation
- Terence L. Kane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION
- Publication number 20120126367
- Publication date May 24, 2012
- International Business Machines Corporation
- Terence L. Kane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION
- Publication number 20120122280
- Publication date May 17, 2012
- International Business Machines Corporation
- Terence L. Kane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION
- Publication number 20110079874
- Publication date Apr 7, 2011
- International Business Machines Corporation
- Terence L. Kane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROGRAMMABLE PRECISION RESISTOR AND METHOD OF PROGRAMMING THE SAME
- Publication number 20100025819
- Publication date Feb 4, 2010
- International Business Machines Corporation
- Anthony G. Domenicucci
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BACKSIDE UNLAYERING OF MOSFET DEVICES FOR ELECTRICAL AND PHYSICAL C...
- Publication number 20080128086
- Publication date Jun 5, 2008
- International Business Machines Corporation
- Terence L. Kane
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR SELECTED SITE BACKSIDE UNLAYERING OF SILIC...
- Publication number 20070010097
- Publication date Jan 11, 2007
- International Business Machines Corporation
- Andrew Deering
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Backside unlayering of MOSFET devices for electrical and physical c...
- Publication number 20060030160
- Publication date Feb 9, 2006
- IBM CORPORATION
- Terence L. Kane
- G01 - MEASURING TESTING
Information Patent Application
Backside unlayering of MOSFET devices for electrical and physical c...
- Publication number 20050148157
- Publication date Jul 7, 2005
- Terence L. Kane
- G01 - MEASURING TESTING
Information Patent Application
SITE-SPECIFIC METHODOLOGY FOR LOCALIZATION AND ANALYZING JUNCTION D...
- Publication number 20050064610
- Publication date Mar 24, 2005
- International Business Machines Corporation
- JOHN BRULEY
- G01 - MEASURING TESTING
Information Patent Application
Structure and method for charge sensitive electrical devices
- Publication number 20040089952
- Publication date May 13, 2004
- Terence Kane
- G01 - MEASURING TESTING
Information Patent Application
Structure for detecting charging effects in device processing
- Publication number 20030094609
- Publication date May 22, 2003
- International Business Machines Corporation
- Terence L. Kane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Structure and method for charge sensitive electrical devices
- Publication number 20030071361
- Publication date Apr 17, 2003
- International Business Machines Corporation
- Terence Kane
- G01 - MEASURING TESTING

Michael Tenney

Person

Patents Grantslast 30 patents

High frequency capacitance-voltage nanoprobing characterization

Inert gas delivery system for electrical inspection apparatus

Inert gas delivery system for electrical inspection apparatus

Antifuse structure for in line circuit modification

Antifuse structure for in line circuit modification

Antifuse structure for in line circuit modification

Antifuse structure for in line circuit modification

Antifuse structure for in line circuit modification

Backside unlayering of MOSFET devices for electrical and physical c...

Programmable precision resistor and method of programming the same

Backside unlayering of MOSFET devices for electrical and physical c...

Apparatus and method for selected site backside unlayering of si, G...

Method of processing backside unlayering of MOSFET devices for elec...

Methods and systems for fabricating electrical connections to semic...

Site-specific methodology for localization and analyzing junction d...

Method for electrically characterizing charge sensitive semiconduct...

Structure for detecting charging effects in device processing

Structure and method for charge sensitive electrical devices

Methods for fabricating electrical connections to semiconductor str...

Patents Applicationslast 30 patents

HIGH FREQUENCY CAPACITANCE-VOLTAGE NANOPROBING CHARACTERIZATION

INERT GAS DELIVERY SYSTEM FOR ELECTRICAL INSPECTION APPARATUS

INERT GAS DELIVERY SYSTEM FOR ELECTRICAL INSPECTION APPARATUS

ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION

ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION

ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION

ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION

ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION

PROGRAMMABLE PRECISION RESISTOR AND METHOD OF PROGRAMMING THE SAME

BACKSIDE UNLAYERING OF MOSFET DEVICES FOR ELECTRICAL AND PHYSICAL C...

APPARATUS AND METHOD FOR SELECTED SITE BACKSIDE UNLAYERING OF SILIC...

Backside unlayering of MOSFET devices for electrical and physical c...

Backside unlayering of MOSFET devices for electrical and physical c...

SITE-SPECIFIC METHODOLOGY FOR LOCALIZATION AND ANALYZING JUNCTION D...

Structure and method for charge sensitive electrical devices

Structure for detecting charging effects in device processing

Structure and method for charge sensitive electrical devices