Michael Thomas McTigue

Person

Colorado Springs, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
DC power rail probes and measurement methods
- Patent number 11,644,488
- Issue date May 9, 2023
- Keysight Technologies, Inc.
- Edward Vernon Brush
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for providing a test signal from a device under test (DUT...
- Patent number 11,573,249
- Issue date Feb 7, 2023
- Keysight Technologies, Inc.
- Ryan Scott
- G02 - OPTICS
Information Patent Grant
Miniature test probe
- Patent number 10,914,756
- Issue date Feb 9, 2021
- Keysight Technologies, Inc.
- Jason Andrew Swaim
- G01 - MEASURING TESTING
Information Patent Grant
High dynamic range probe using pole-zero cancellation
- Patent number 10,886,588
- Issue date Jan 5, 2021
- Keysight Technologies, Inc.
- Michael J. Lujan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single ended test probe having ground and signal tips
- Patent number 9,857,392
- Issue date Jan 2, 2018
- Keysight Technologies, Inc.
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Grant
Browser probe
- Patent number 9,797,927
- Issue date Oct 24, 2017
- Keysight Technologies, Inc.
- Michael T. McTigue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Oscilloscope system and method for simultaneously displaying zoomed...
- Patent number 9,459,290
- Issue date Oct 4, 2016
- Keysight Technologies, Inc.
- Kenneth W. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope probe having output clamping circuit
- Patent number 9,423,422
- Issue date Aug 23, 2016
- Keysight Technologies, Inc.
- Edward Vernon Brush
- G01 - MEASURING TESTING
Information Patent Grant
Measurement probe providing different levels of amplification for s...
- Patent number 9,316,669
- Issue date Apr 19, 2016
- Keysight Technologies, Inc.
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Grant
Compliant micro-browser for a hand held probe
- Patent number 7,102,370
- Issue date Sep 5, 2006
- Agilent Technologies, Inc.
- James E. Cannon
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for canceling DC errors and noise generated by...
- Patent number 7,005,868
- Issue date Feb 28, 2006
- Agilent Technologies, Inc.
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Grant
Measurement interface optimized for both differential and single-en...
- Patent number 6,931,331
- Issue date Aug 16, 2005
- Agilent Technologies, Inc.
- Michael Thomas McTigue
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Voltage probe
- Patent number 6,864,694
- Issue date Mar 8, 2005
- Agilent Technologies, Inc.
- Michael Thomas McTigue
- G01 - MEASURING TESTING
Information Patent Grant
Differential voltage probe
- Patent number 6,856,126
- Issue date Feb 15, 2005
- Agilent Technologies, Inc.
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for wideband single-end probing of variabily sp...
- Patent number 6,831,452
- Issue date Dec 14, 2004
- Agilent Technologies, Inc.
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for wideband differential probing of variably s...
- Patent number 6,828,768
- Issue date Dec 7, 2004
- Agilent Technologies, Inc.
- Michael McTigue
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for canceling DC errors and noise generated by...
- Patent number 6,806,697
- Issue date Oct 19, 2004
- Agilent Technologies, Inc.
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for tagging measurement values
- Patent number 6,725,172
- Issue date Apr 20, 2004
- Agilent Technologies, Inc.
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for wideband active probing of devices and circ...
- Patent number 6,704,670
- Issue date Mar 9, 2004
- Agilent Technologies, Inc.
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Grant
System and method for improving linearity and reducing digitization...
- Patent number 6,704,673
- Issue date Mar 9, 2004
- Agilent Technologies, Inc.
- Michael T. McTigue
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
BANDWIDTH IMPROVEMENT OF THROUGH-HOLE DISTRIBUTED FEEDBACK LASER
- Publication number 20250112437
- Publication date Apr 3, 2025
- KEYSIGHT TECHNOLOGIES, INC.
- Michael Thomas McTigue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS
- Publication number 20240230718
- Publication date Jul 11, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Hal Robert Paver
- G01 - MEASURING TESTING
Information Patent Application
VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS
- Publication number 20240133921
- Publication date Apr 25, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Hal Robert Paver
- G01 - MEASURING TESTING
Information Patent Application
DC POWER RAIL PROBES AND MEASUREMENT METHODS
- Publication number 20210199700
- Publication date Jul 1, 2021
- Keysight Technologies, Inc.
- Edward Vernon Brush
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR PROVIDING A TEST SIGNAL FROM A DEVICE UNDER TEST (DUT...
- Publication number 20210190830
- Publication date Jun 24, 2021
- KEYSIGHT TECHNOLOGIES, INC.
- Ryan Scott
- G02 - OPTICS
Information Patent Application
HIGH DYNAMIC RANGE PROBE USING POLE-ZERO CANCELLATION
- Publication number 20200099117
- Publication date Mar 26, 2020
- KEYSIGHT TECHNOLOGIES, INC.
- Michael J. Lujan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MINIATURE TEST PROBE
- Publication number 20200057094
- Publication date Feb 20, 2020
- KEYSIGHT TECHNOLOGIES, INC.
- Jason Andrew Swaim
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
BROWSER PROBE
- Publication number 20160216320
- Publication date Jul 28, 2016
- Keysight Technologies, Inc.
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-ENDED TEST PROBE HAVING GROUND AND SIGNAL TIPS
- Publication number 20160178664
- Publication date Jun 23, 2016
- Keysight Technologies, Inc.
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT PROBE PROVIDING DIFFERENT LEVELS OF AMPLIFICATION FOR S...
- Publication number 20150002136
- Publication date Jan 1, 2015
- Keysight Technologies, Inc.
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Application
OSCILLOSCOPE PROBE HAVING OUTPUT CLAMPING CIRCUIT
- Publication number 20140320157
- Publication date Oct 30, 2014
- AGILENT TECHNOLOGIES, INC.
- Edward Vernon BRUSH
- G01 - MEASURING TESTING
Information Patent Application
OSCILLOSCOPE SYSTEM AND METHOD FOR SIMULTANEOUSLY DISPLAYING ZOOMED...
- Publication number 20140320145
- Publication date Oct 30, 2014
- AGILENT TECHNOLOGIES, INC.
- Kenneth W. Johnson
- G01 - MEASURING TESTING
Information Patent Application
OSCILLOSCOPE PROBE COMPRISING STATUS INDICATOR
- Publication number 20130106401
- Publication date May 2, 2013
- AGILENT TECHNOLOGIES, INC.
- Kenneth W. JOHNSON
- G01 - MEASURING TESTING
Information Patent Application
High bandwidth probe system
- Publication number 20070222468
- Publication date Sep 27, 2007
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Application
Connection accessory for micro-probing
- Publication number 20070115010
- Publication date May 24, 2007
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Application
High bandwidth probe
- Publication number 20070063715
- Publication date Mar 22, 2007
- James E. Cannon
- G01 - MEASURING TESTING
Information Patent Application
High bandwidth probe
- Publication number 20070063714
- Publication date Mar 22, 2007
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Application
Signal probe and probe assembly
- Publication number 20070057682
- Publication date Mar 15, 2007
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Application
Micro gap method and ESD protection device
- Publication number 20060250744
- Publication date Nov 9, 2006
- Michael T. McTigue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High frequency oscilloscope probe with unitized probe tips
- Publication number 20060061348
- Publication date Mar 23, 2006
- James E. Cannon
- G01 - MEASURING TESTING
Information Patent Application
Measurement interface optimized for both differential and single-en...
- Publication number 20050251352
- Publication date Nov 10, 2005
- Michael Thomas McTigue
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Compliant micro-browser for a hand held probe
- Publication number 20050237078
- Publication date Oct 27, 2005
- James E. Cannon
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT INTERFACE OPTIMIZED FOR BOTH DIFFERENTIAL AND SINGLE-EN...
- Publication number 20050114047
- Publication date May 26, 2005
- Michael Thomas McTigue
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Apparatus and method for canceling DC errors and noise generated by...
- Publication number 20040196021
- Publication date Oct 7, 2004
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Application
Differential voltage probe
- Publication number 20040140819
- Publication date Jul 22, 2004
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Application
Voltage probe
- Publication number 20040085057
- Publication date May 6, 2004
- Michael Thomas McTigue
- G01 - MEASURING TESTING
Information Patent Application
System and method for improving linearity and reducing digitization...
- Publication number 20040030518
- Publication date Feb 12, 2004
- Michael T. McTigue
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Systems and methods for tagging measurement values
- Publication number 20030200044
- Publication date Oct 23, 2003
- Michael T. McTigue
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for wideband differential probing of variably s...
- Publication number 20030193341
- Publication date Oct 16, 2003
- Michael McTigue
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for wideband active probing of devices and circ...
- Publication number 20030195713
- Publication date Oct 16, 2003
- Michael T. McTigue
- G01 - MEASURING TESTING

Michael Thomas McTigue

Person

Patents Grantslast 30 patents

DC power rail probes and measurement methods

Apparatus for providing a test signal from a device under test (DUT...

Miniature test probe

High dynamic range probe using pole-zero cancellation

Single ended test probe having ground and signal tips

Browser probe

Oscilloscope system and method for simultaneously displaying zoomed...

Oscilloscope probe having output clamping circuit

Measurement probe providing different levels of amplification for s...

Compliant micro-browser for a hand held probe

Apparatus and method for canceling DC errors and noise generated by...

Measurement interface optimized for both differential and single-en...

Voltage probe

Differential voltage probe

Systems and methods for wideband single-end probing of variabily sp...

Systems and methods for wideband differential probing of variably s...

Apparatus and method for canceling DC errors and noise generated by...

Systems and methods for tagging measurement values

Systems and methods for wideband active probing of devices and circ...

System and method for improving linearity and reducing digitization...

Patents Applicationslast 30 patents

BANDWIDTH IMPROVEMENT OF THROUGH-HOLE DISTRIBUTED FEEDBACK LASER

VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS

VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS

DC POWER RAIL PROBES AND MEASUREMENT METHODS

APPARATUS FOR PROVIDING A TEST SIGNAL FROM A DEVICE UNDER TEST (DUT...

HIGH DYNAMIC RANGE PROBE USING POLE-ZERO CANCELLATION

MINIATURE TEST PROBE

BROWSER PROBE

SINGLE-ENDED TEST PROBE HAVING GROUND AND SIGNAL TIPS

MEASUREMENT PROBE PROVIDING DIFFERENT LEVELS OF AMPLIFICATION FOR S...

OSCILLOSCOPE PROBE HAVING OUTPUT CLAMPING CIRCUIT

OSCILLOSCOPE SYSTEM AND METHOD FOR SIMULTANEOUSLY DISPLAYING ZOOMED...

OSCILLOSCOPE PROBE COMPRISING STATUS INDICATOR

High bandwidth probe system

Connection accessory for micro-probing

High bandwidth probe

High bandwidth probe

Signal probe and probe assembly

Micro gap method and ESD protection device

High frequency oscilloscope probe with unitized probe tips

Measurement interface optimized for both differential and single-en...

Compliant micro-browser for a hand held probe

MEASUREMENT INTERFACE OPTIMIZED FOR BOTH DIFFERENTIAL AND SINGLE-EN...

Apparatus and method for canceling DC errors and noise generated by...

Differential voltage probe

Voltage probe

System and method for improving linearity and reducing digitization...

Systems and methods for tagging measurement values

Systems and methods for wideband differential probing of variably s...

Systems and methods for wideband active probing of devices and circ...