Michael Ugarov

Person

Loveland, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Ion deflection in time-of-flight mass spectrometry
- Patent number 9,029,763
- Issue date May 12, 2015
- Agilent Technologies, Inc.
- Michael Ugarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atmospheric pressure interface with improved ion transfer for spect...
- Patent number 8,952,326
- Issue date Feb 10, 2015
- Agilent Technologies, Inc.
- Michael Ugarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transient level data acquisition and peak correction for time-of-fl...
- Patent number 8,723,108
- Issue date May 13, 2014
- Agilent Technologies, Inc.
- Michael Ugarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data acquisition modes for ion mobility time-of-flight mass spectro...
- Patent number 8,633,436
- Issue date Jan 21, 2014
- Agilent Technologies, Inc.
- Michael Ugarov
- G01 - MEASURING TESTING
Information Patent Grant
Ion slicer with accelleration and decelleration optics
- Patent number 8,481,963
- Issue date Jul 9, 2013
- Agilent Technologies, Inc.
- Harvey D. Loucks
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Input port for mass spectrometers that is adapted for use with ion...
- Patent number 8,389,930
- Issue date Mar 5, 2013
- Agilent Technologies, Inc.
- Michael Ugarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Converging multipole ion guide for ion beam shaping
- Patent number 8,193,489
- Issue date Jun 5, 2012
- Agilent Technologies, Inc.
- James L. Bertsch
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
ION DEFLECTION IN TIME-OF-FLIGHT MASS SPECTROMETRY
- Publication number 20150060656
- Publication date Mar 5, 2015
- AGILENT TECHNOLOGIES, INC.
- Michael Ugarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSIENT LEVEL DATA ACQUISITION AND PEAK CORRECTION FOR TIME-OF-FL...
- Publication number 20140110574
- Publication date Apr 24, 2014
- AGILENT TECHNOLOGIES, INC.
- Michael Ugarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA ACQUISITION MODES FOR ION MOBILITY TIME-OF-FLIGHT MASS SPECTRO...
- Publication number 20130161506
- Publication date Jun 27, 2013
- AGILENT TECHNOLOGIES, INC.
- MICHAEL UGAROV
- G01 - MEASURING TESTING
Information Patent Application
ION SLICER WITH ACCELLERATION AND DECELLERATION OPTICS
- Publication number 20120217387
- Publication date Aug 30, 2012
- Harvey D. Loucks, JR.
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Bladed Ion Slicer
- Publication number 20120217388
- Publication date Aug 30, 2012
- Harvey D. Loucks, JR.
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Input Port for Mass Spectrometers that is Adapted for use with Ion...
- Publication number 20110266432
- Publication date Nov 3, 2011
- Michael Ugarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONVERGING MULTIPOLE ION GUIDE FOR ION BEAM SHAPING
- Publication number 20100301210
- Publication date Dec 2, 2010
- AGILENT TECHNOLOGIES, INC.
- JAMES L. BERTSCH
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Michael Ugarov

Person

Patents Grantslast 30 patents

Ion deflection in time-of-flight mass spectrometry

Atmospheric pressure interface with improved ion transfer for spect...

Transient level data acquisition and peak correction for time-of-fl...

Data acquisition modes for ion mobility time-of-flight mass spectro...

Ion slicer with accelleration and decelleration optics

Input port for mass spectrometers that is adapted for use with ion...

Converging multipole ion guide for ion beam shaping

Patents Applicationslast 30 patents

ION DEFLECTION IN TIME-OF-FLIGHT MASS SPECTROMETRY

TRANSIENT LEVEL DATA ACQUISITION AND PEAK CORRECTION FOR TIME-OF-FL...

DATA ACQUISITION MODES FOR ION MOBILITY TIME-OF-FLIGHT MASS SPECTRO...

ION SLICER WITH ACCELLERATION AND DECELLERATION OPTICS

Bladed Ion Slicer

Input Port for Mass Spectrometers that is Adapted for use with Ion...

CONVERGING MULTIPOLE ION GUIDE FOR ION BEAM SHAPING