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Michael Vainer
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Yoqneam Elit, IL
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last 30 patents
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Patent Grant
Wafer inspection system and a method for translating wafers
Patent number
8,573,077
Issue date
Nov 5, 2013
Camtek Ltd.
Itzik Nisany
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
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Patent Grant
Wafer inspection system and a method for translating wafers [PD]
Patent number
8,281,674
Issue date
Oct 9, 2012
Camtek Ltd.
Itzik Nisany
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
WAFER INSPECTION SYSTEM AND A METHOD FOR TRANSLATING WAFERS
Publication number
20130115030
Publication date
May 9, 2013
Camtek LTD.
Itzik Nisany
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Application
INSPECTION SYSTEM AND A METHOD FOR INSPECTING MULTIPLE WAFERS
Publication number
20130050468
Publication date
Feb 28, 2013
CAMTEK LTD
Gilad Golan
G01 - MEASURING TESTING
Information
Patent Application
WAFER INSPECTION SYSTEM AND A METHOD FOR TRANSLATING WAFERS [PD]
Publication number
20090183583
Publication date
Jul 23, 2009
Itzik Nisany
G01 - MEASURING TESTING