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Michael Veith
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Wetzlar, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Illuminating device
Patent number
7,268,940
Issue date
Sep 11, 2007
Vistec Semiconductor Systems GmbH
Michael Veith
G02 - OPTICS
Information
Patent Grant
Setting module for the illumination of an optical instrument
Patent number
7,002,740
Issue date
Feb 21, 2006
Leica Microsystems Jena GmbH
Michael Veith
G02 - OPTICS
Information
Patent Grant
Autofocus module and method for a microscope-based system
Patent number
6,879,440
Issue date
Apr 12, 2005
Leica Microsystems Semiconductor GmbH
Franz Cemic
G02 - OPTICS
Information
Patent Grant
Arrangement and method for illuminating a specimen field in an opti...
Patent number
6,713,746
Issue date
Mar 30, 2004
Leica Microsystems Jena GmbH
Michael Veith
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for optically examining structured surfaces of ob...
Patent number
6,633,375
Issue date
Oct 14, 2003
Leica Microsystems Semiconductor GmbH
Michael Veith
G01 - MEASURING TESTING
Information
Patent Grant
Illumination device for a DUV microscope and DUV microscope
Patent number
6,624,930
Issue date
Sep 23, 2003
Leica Microsystems Wetzlar GmbH
Lambert Danner
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
Illuminating device
Publication number
20040136057
Publication date
Jul 15, 2004
Michael Veith
G02 - OPTICS
Information
Patent Application
Autofocus module and method for a microscope-based system
Publication number
20030147134
Publication date
Aug 7, 2003
Leica Microsystems Semiconductor GmbH
Franz Cemic
G02 - OPTICS
Information
Patent Application
Arrangement and method for illuminating a specimen field in an opti...
Publication number
20030015643
Publication date
Jan 23, 2003
LEICA MICROSYSTEMS JENA GmbH
Michael Veith
G01 - MEASURING TESTING
Information
Patent Application
Setting module for the illumination of an optical instrument
Publication number
20030011882
Publication date
Jan 16, 2003
LEICA MICROSYSTEMS JENA GmbH
Michael Veith
G02 - OPTICS