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Michael W. HAMBLIN
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Stow, MA, US
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Patents Grants
last 30 patents
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Patent Grant
X-ray inspection of solder reflow in high-density printed circuit b...
Patent number
8,031,929
Issue date
Oct 4, 2011
Teradyne, Inc.
Govindarajan T. Srinivasan
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method of and system for calibration of inspection systems producin...
Patent number
7,819,581
Issue date
Oct 26, 2010
Teradyne, Inc.
Govindarajan T. Srinivasan
G01 - MEASURING TESTING
Information
Patent Grant
Method of and system for obtaining linear data for object scanned u...
Patent number
7,626,175
Issue date
Dec 1, 2009
Teradyne, Inc.
Peter A. Reichert
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Circuit-board tester with backdrive-based burst timing
Patent number
6,175,230
Issue date
Jan 16, 2001
GenRad, Inc.
Michael W. Hamblin
G01 - MEASURING TESTING
Information
Patent Grant
System for detecting faults in connections between integrated circu...
Patent number
5,736,862
Issue date
Apr 7, 1998
Genrad, Inc.
Michael W. Hamblin
G01 - MEASURING TESTING
Information
Patent Grant
Method for automatic open-circuit detection
Patent number
5,414,715
Issue date
May 9, 1995
GenRad, Inc.
Michael W. Hamblin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF AND SYSTEM FOR CALIBRATION OF INSPECTION SYSTEMS PRODUCIN...
Publication number
20090218480
Publication date
Sep 3, 2009
Govindarajan T. SRINIVASAN
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF AND SYSTEM FOR OBTAINING LINEAR DATA FOR OBJECT SCANNED U...
Publication number
20090218498
Publication date
Sep 3, 2009
Peter A. Reichert
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY INSPECTION OF SOLDER REFLOW IN HIGH-DENSITY PRINTED CIRCUIT B...
Publication number
20090080764
Publication date
Mar 26, 2009
Teradyne, Inc.
Govindarajan T. SRINIVASAN
G06 - COMPUTING CALCULATING COUNTING