Michael Wayne White

Person

Lafayette, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multiple uses for BIST test latches
- Patent number 8,006,153
- Issue date Aug 23, 2011
- International Business Machines Corporation
- Steven Ross Ferguson
- G01 - MEASURING TESTING
Information Patent Grant
Multiple uses for BIST test latches
- Patent number 7,574,642
- Issue date Aug 11, 2009
- International Business Machines Corporation
- Steven Ross Ferguson
- G01 - MEASURING TESTING
Information Patent Grant
Memory array manufacturing defect detection system and method
- Patent number 7,318,182
- Issue date Jan 8, 2008
- International Business Machines Corporation
- Louis Bernard Bushard
- G11 - INFORMATION STORAGE
Information Patent Grant
Enhanced security features for an automated order fulfillment system
- Patent number 6,968,314
- Issue date Nov 22, 2005
- International Business Machines Corporation
- Michael T. White
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for providing additional addressable functional s...
- Patent number 6,192,444
- Issue date Feb 20, 2001
- International Business Machines Corporation
- Michael Wayne White
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
MVS device backup system for a data processor using a data storage...
- Patent number 6,119,208
- Issue date Sep 12, 2000
- Storage Technology Corporation
- Michael Wayne White
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
DASD file copy system for a data processor using a data storage sub...
- Patent number 6,108,749
- Issue date Aug 22, 2000
- Storage Technology Corporation
- Michael Wayne White
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for providing write notification during data set copy
- Patent number 5,915,264
- Issue date Jun 22, 1999
- Storage Technology Corporation
- Michael Wayne White
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE USES FOR BIST TEST LATCHES
- Publication number 20080313512
- Publication date Dec 18, 2008
- Steven Ross Ferguson
- G01 - MEASURING TESTING
Information Patent Application
Multiple uses for bist test latches
- Publication number 20060242519
- Publication date Oct 26, 2006
- Steven Ross Ferguson
- G01 - MEASURING TESTING
Information Patent Application
Memory array manufacturing defect detection system and method
- Publication number 20060156090
- Publication date Jul 13, 2006
- International Business Machines Corporation
- Louis Bernard Bushard
- G11 - INFORMATION STORAGE

Michael Wayne White

Person

Patents Grantslast 30 patents

Multiple uses for BIST test latches

Multiple uses for BIST test latches

Memory array manufacturing defect detection system and method

Enhanced security features for an automated order fulfillment system

Method and system for providing additional addressable functional s...

MVS device backup system for a data processor using a data storage...

DASD file copy system for a data processor using a data storage sub...

System for providing write notification during data set copy

Patents Applicationslast 30 patents

MULTIPLE USES FOR BIST TEST LATCHES

Multiple uses for bist test latches

Memory array manufacturing defect detection system and method