Michael Weber-Grabau

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Object detection systems
- Patent number 10,914,837
- Issue date Feb 9, 2021
- onVector Technologies LLC
- Michael Weber-Grabau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Object detection systems
- Patent number 10,585,192
- Issue date Mar 10, 2020
- onVector Technology LLC
- Michael Weber-Grabau
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Object detection systems
- Patent number 10,261,184
- Issue date Apr 16, 2019
- onVector Technology LLC
- Michael Weber-Grabau
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Object detection systems
- Patent number 9,915,732
- Issue date Mar 13, 2018
- onVector Technology LLC
- Michael Weber-Grabau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Object detection systems
- Patent number 9,335,413
- Issue date May 10, 2016
- onVector Technology LLC
- Michael Weber-Grabau
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for analyzing a specimen using atomic force mic...
- Patent number 7,430,898
- Issue date Oct 7, 2008
- KLA-Tencor Technologies Corp.
- Michael Weber-Grabau
- G01 - MEASURING TESTING
Information Patent Grant
Direct relative motion measurement for vibration induced noise and...
- Patent number 7,249,002
- Issue date Jul 24, 2007
- KLA-Tencor Technologies Corporation
- Yuval Ben-Dov
- G01 - MEASURING TESTING
Information Patent Grant
Wafer metrology apparatus and method
- Patent number 6,919,958
- Issue date Jul 19, 2005
- Therma-Wave, Inc.
- Fred E. Stanke
- B24 - GRINDING POLISHING
Information Patent Grant
Bathless wafer measurement apparatus and method
- Patent number 6,572,456
- Issue date Jun 3, 2003
- Sensys Instruments Corporation
- Michael Weber-Grabau
- B24 - GRINDING POLISHING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR RECORDING AND/OR MONITORING POPULATIONS OF IN...
- Publication number 20200367483
- Publication date Nov 26, 2020
- BIOGENTS AG
- Martin GEIER
- G01 - MEASURING TESTING
Information Patent Application
OBJECT DETECTION SYSTEMS
- Publication number 20200209390
- Publication date Jul 2, 2020
- Michael WEBER-GRABAU
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
Object Detection Systems
- Publication number 20190187281
- Publication date Jun 20, 2019
- onVector Technology LLC
- Michael Weber-Grabau
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
Object Detection Systems
- Publication number 20180203114
- Publication date Jul 19, 2018
- onVector Technology LLC
- Michael Weber-Grabau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Object Detection Systems
- Publication number 20160245916
- Publication date Aug 25, 2016
- onVector Technology LLC
- Michael Weber-Grabau
- G01 - MEASURING TESTING
Information Patent Application
OBJECT DETECTION SYSTEMS
- Publication number 20150234049
- Publication date Aug 20, 2015
- onVector Technology, LLC
- Michael Weber-Grabau
- G01 - MEASURING TESTING
Information Patent Application
Bathless wafer measurement apparatus and method
- Publication number 20020065028
- Publication date May 30, 2002
- Michael Weber-Grabau
- B24 - GRINDING POLISHING
Information Patent Application
Optical critical dimension metrology system integrated into semicon...
- Publication number 20020018217
- Publication date Feb 14, 2002
- Michael Weber-Grabau
- G01 - MEASURING TESTING

Michael Weber-Grabau

Person

Patents Grantslast 30 patents

Object detection systems

Object detection systems

Object detection systems

Object detection systems

Object detection systems

Methods and systems for analyzing a specimen using atomic force mic...

Direct relative motion measurement for vibration induced noise and...

Wafer metrology apparatus and method

Bathless wafer measurement apparatus and method

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR RECORDING AND/OR MONITORING POPULATIONS OF IN...

OBJECT DETECTION SYSTEMS

Object Detection Systems

Object Detection Systems

Object Detection Systems

OBJECT DETECTION SYSTEMS

Bathless wafer measurement apparatus and method

Optical critical dimension metrology system integrated into semicon...