Michael Z. Felske

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Milton, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Partial good integrated circuit and method of testing same
- Patent number 7,478,301
- Issue date Jan 13, 2009
- International Business Machines Corporation
- Leonard O. Farnsworth, III
- G11 - INFORMATION STORAGE
Information Patent Grant
Partial good integrated circuit and method of testing same
- Patent number 7,434,129
- Issue date Oct 7, 2008
- International Business Machines Corporation
- Leonard O. Farnsworth, III
- G11 - INFORMATION STORAGE
Information Patent Grant
Partial good integrated circuit and method of testing same
- Patent number 7,305,600
- Issue date Dec 4, 2007
- International Business Machines Corporation
- Leonard O. Farnsworth, III
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
PARTIAL GOOD INTEGRATED CIRCUIT AND METHOD OF TESTING SAME
- Publication number 20080209289
- Publication date Aug 28, 2008
- Leonard O. Farnsworth
- G01 - MEASURING TESTING
Information Patent Application
PARTIAL GOOD INTEGRATED CIRCUIT AND METHOD OF TESTING SAME
- Publication number 20080010571
- Publication date Jan 10, 2008
- Leonard O. Farnsworth
- G01 - MEASURING TESTING
Information Patent Application
Partial good integrated circuit and method of testing same
- Publication number 20050047224
- Publication date Mar 3, 2005
- International Business Machines Corporation
- Leonard O. Farnsworth
- G01 - MEASURING TESTING