Michal Avinun-Kalish

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Nes Ziona, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method of operating a charged particle beam specimen inspection system
- Patent number 10,522,327
- Issue date Dec 31, 2019
- Applied Materials Israel Ltd.
- Gilad Erel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam specimen inspection system and method for ope...
- Patent number 10,056,228
- Issue date Aug 21, 2018
- Applied Materials Israel Ltd.
- Gilad Erel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for generating and reviewing a thin sample
- Patent number 7,659,506
- Issue date Feb 9, 2010
- Applied Materials, Israel, Ltd.
- Michal Avinun-Kalish
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF OPERATING A CHARGED PARTICLE BEAM SPECIMEN INSPECTION SYSTEM
- Publication number 20180330919
- Publication date Nov 15, 2018
- Applied Materials Isarael Ltd.
- Gilad Erel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SPECIMEN INSPECTION SYSTEM AND METHOD FOR OPE...
- Publication number 20160035537
- Publication date Feb 4, 2016
- APPLIED MATERIALS ISRAEL, LTD.
- Gilad Erel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR GENERATING AND REVIEWING A THIN SAMPLE
- Publication number 20090078867
- Publication date Mar 26, 2009
- Michal Avinun-Kalish
- G01 - MEASURING TESTING