Michal Eilon

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Beit Elazari, IL

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Patents Grantslast 30 patents

Information Patent Grant
Cleanliness monitor and a method for monitoring a cleanliness of a...
- Patent number 11,049,704
- Issue date Jun 29, 2021
- Applied Materials Israel Ltd.
- Irit Ruach-Nir
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cleanliness monitor and a method for monitoring a cleanliness of a...
- Patent number 10,910,204
- Issue date Feb 2, 2021
- Applied Materials Israel Ltd.
- Irit Ruach-Nir
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cleanliness monitor and a method for monitoring a cleanliness of a...
- Patent number 10,217,621
- Issue date Feb 26, 2019
- Applied Materials Israel Ltd.
- Irit Ruach-Nir
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for monitoring chamber cleanliness
- Patent number 8,361,814
- Issue date Jan 29, 2013
- Applied Materials, Israel, Ltd.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
NON-DESTRUCTIVE CLASSIFICATION OF SPECIMENS BASED ON ENERGY SIGNATU...
- Publication number 20240255449
- Publication date Aug 1, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
- Publication number 20240094150
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
- Publication number 20240096591
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Z-PROFILING OF WAFERS BASED ON X-RAY MEASUREMENTS
- Publication number 20240085356
- Publication date Mar 14, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEPTH-PROFILING OF SAMPLES BASED ON X-RAY MEASUREMENTS
- Publication number 20240085351
- Publication date Mar 14, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for monitoring chamber cleanliness
- Publication number 20060216839
- Publication date Sep 28, 2006
- APPLIED MATERIALS, ISRAEL, LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS