Michal Haim YACHINIA

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Rehovot, IL

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Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR OPTICAL CHARACTERIZATION OF PATTERNED SAMPLES
- Publication number 20150316468
- Publication date Nov 5, 2015
- NOVA MEASURING INSTRUMENTS LTD.
- Dror SHAFIR
- G01 - MEASURING TESTING