Michal Hrouzek

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Brno, CZ

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Patents Grantslast 30 patents

Information Patent Grant
Broad ion beam (BIB) systems for more efficient processing of multi...
- Patent number 12,228,484
- Issue date Feb 18, 2025
- FEI Company
- Michal Hrouzek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and methods for automated processing of multiple samples in...
- Patent number 12,165,833
- Issue date Dec 10, 2024
- FEI Company
- Michal Hrouzek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for pre-aligning samples for more efficient pro...
- Patent number 12,106,931
- Issue date Oct 1, 2024
- FEI Company
- Michal Hrouzek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle microscope with in situ deposition functionality
- Patent number 10,475,629
- Issue date Nov 12, 2019
- FEI Company
- John Mitchels
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Specimen holder for a charged particle microscope
- Patent number 9,741,527
- Issue date Aug 22, 2017
- FEI Company
- Tomas Vystavel
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
COMBINED LASER AND BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT...
- Publication number 20230420216
- Publication date Dec 28, 2023
- FEI Company
- Krishna Kanth NEELISETTY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BROAD ION BEAM (BIB) SYSTEMS FOR MORE EFFICIENT PROCESSING OF MULTI...
- Publication number 20230375445
- Publication date Nov 23, 2023
- FEI Company
- Michal HROUZEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHODS FOR AUTOMATED PROCESSING OF MULTIPLE SAMPLES IN...
- Publication number 20230377833
- Publication date Nov 23, 2023
- FEI Company
- Michal HROUZEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PRE-ALIGNING SAMPLES FOR MORE EFFICIENT PRO...
- Publication number 20230377834
- Publication date Nov 23, 2023
- FEI Company
- Michal HROUZEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE MICROSCOPE WITH IN SITU DEPOSITION FUNCTIONALITY
- Publication number 20170345627
- Publication date Nov 30, 2017
- FEI Company
- John Mitchels
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SPECIMEN HOLDER FOR A CHARGED PARTICLE MICROSCOPE
- Publication number 20160181059
- Publication date Jun 23, 2016
- FEI Company
- Tomas Vystavel
- H01 - BASIC ELECTRIC ELEMENTS